Inventor · disambiguated record
Yusaku Ono
Also filed as: ONO YUSAKU
8 granted patents·115 citations·filing 1998–2013
86Inventor score
Top patents by PatentIndex Score
8 records- 0186US6298473B1Apparatus and method for inhibiting pattern distortions to correct pattern data in a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 2, 2001·69 cites·17 claims
- 0277US8103977B2Semiconductor device and its manufacturing method, semiconductor manufacturing mask, and optical proximity processing methodTAOKA HIRONOBU·Filed 2006·Granted Jan 24, 2012·15 cites·24 claims
- 0372US7844934B2Method for designing a semiconductor integrated circuit layout capable of reducing the processing time for optical proximity effect correctionRENESAS ELECTRONICS CORP·Filed 2006·Granted Nov 30, 2010·7 cites·8 claims
- 0470US8458627B2Semiconductor device including logic circuit having areas of different optical proximity accuracyTAOKA HIRONOBU·Filed 2011·Granted Jun 4, 2013·3 cites·23 claims
- 0569US6687885B2Correction of layout pattern data during semiconductor patterning processRENESAS TECH CORP·Filed 2001·Granted Feb 3, 2004·11 cites·16 claims
- 0666US6536015B2Apparatus and method of correcting layout pattern data, method of manufacturing semiconductor devices and recording mediumMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Mar 18, 2003·9 cites·18 claims
- 0760US8719740B2Semiconductor device which is subjected to optical proximity correctionRENESAS ELECTRONICS CORP·Filed 2013·Granted May 6, 2014·1 cites·20 claims
- 0836US6848096B2Apparatus for correcting data of layout patternRENESAS TECH CORP·Filed 2003·Granted Jan 25, 2005·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →