Inventor · disambiguated record
Kunihiko Take
Also filed as: TAKE KUNIHIKO
2 granted patents·1 pending application·21 citations·filing 2000–2009
52Inventor score
Files withSONY CORP3
Top patents by PatentIndex Score
3 records- 0167US7035447B2Semiconductor wafer examination systemSONY CORP·Filed 2000·Granted Apr 25, 2006·21 cites·1 claims
- 0247US7657700B2Recording device, recording-medium-management method, program of recording-medium-management method, and recording medium recording program of recording-medium-management methodSONY CORP·Filed 2006·Granted Feb 2, 2010·0 cites·13 claims
- 0347US2009210645A1Recording control apparatus, one-time recording medium, recording system, and recording medium control method and programSONY CORP·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →