Inventor · disambiguated record
Kohtaro Hosoya
Also filed as: HOSOYA Kohtaro
2 granted patents·0 citations·filing 2013–2014
22Inventor score
Technology areasH01J
Files withHITACHI HIGH TECH CORP2
Top patents by PatentIndex Score
2 records- 0145US9362083B2Charged particle beam apparatus and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 7, 2016·0 cites·17 claims
- 0243US10176968B2Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for sameHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 8, 2019·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →