Inventor · disambiguated record
Hitoshi Izuru
Also filed as: IZURU HITOSHI
3 granted patents·2 pending applications·18 citations·filing 2000–2008
63Inventor score
Top patents by PatentIndex Score
5 records- 0179US7915720B2Semiconductor integrated circuit device and test method thereofFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Mar 29, 2011·11 cites·18 claims
- 0249US2008227226A1Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2008·Application pending·0 cites
- 0348US6462574B1Burn-in system, burn-in control technique, and semiconductor device production method using said system and techniqueFUJITSU LTD·Filed 2000·Granted Oct 8, 2002·7 cites·5 claims
- 0444US2006097356A1Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2005·Application pending·0 cites
- 0538US7199600B2Semiconductor device testing method and testing equipmentFUJITSU LTD·Filed 2005·Granted Apr 3, 2007·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →