Inventor · disambiguated record
John F. Moulder
Also filed as: MOULDER JOHN F
3 granted patents·1 pending application·96 citations·filing 1984–2002
73Inventor score
Top patents by PatentIndex Score
4 records- 0191US6800852B2Nondestructive characterization of thin films using measured basis spectraREVERA INC·Filed 2002·Granted Oct 5, 2004·72 cites·55 claims
- 0266US7449682B2System and method for depth profiling and characterization of thin filmsREVERA INC·Filed 2002·Granted Nov 11, 2008·8 cites·34 claims
- 0351US4513905AIntegrated circuit metallization techniquePERKIN ELMER CORP·Filed 1984·Granted Apr 30, 1985·16 cites·12 claims
- 0443US2003080291A1System and method for characterization of thin filmsPHYSICAL ELECTRONICS IND INC·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →