Inventor · disambiguated record
Sue Crank
Also filed as: CRANK SUE · CRANK SUE E · CRANK SUE ELLEN
12 granted patents·345 citations·filing 1987–2008
92Inventor score
Files withTEXAS INSTRUMENTS INC12
Top patents by PatentIndex Score
12 records- 0195US7211516B2Nickel silicide including indium and a method of manufacture thereforTEXAS INSTRUMENTS INC·Filed 2005·Granted May 1, 2007·34 cites·16 claims
- 0293US7511350B2Nickel alloy silicide including indium and a method of manufacture thereforTEXAS INSTRUMENTS INC·Filed 2008·Granted Mar 31, 2009·20 cites·5 claims
- 0393US7344985B2Nickel alloy silicide including indium and a method of manufacture thereforTEXAS INSTRUMENTS INC·Filed 2006·Granted Mar 18, 2008·21 cites·14 claims
- 0493US5316974AIntegrated circuit copper metallization process using a lift-off seed layer and a thick-plated conductor layerTEXAS INSTRUMENTS INC·Filed 1990·Granted May 31, 1994·170 cites·12 claims
- 0592US7355255B2Nickel silicide including indium and a method of manufacture thereforTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 8, 2008·17 cites·6 claims
- 0662US4874723ASelective etching of tungsten by remote and in situ plasma generationTEXAS INSTRUMENTS INC·Filed 1987·Granted Oct 17, 1989·27 cites·17 claims
- 0762US4849067AMethod for etching tungstenTEXAS INSTRUMENTS INC·Filed 1987·Granted Jul 18, 1989·27 cites·2 claims
- 0860US7029967B2Silicide method for CMOS integrated circuitsTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 18, 2006·7 cites·12 claims
- 0946US7132365B2Treatment of silicon prior to nickel silicide formationTEXAS INSTRUMENTS INC·Filed 2004·Granted Nov 7, 2006·2 cites·10 claims
- 1041US7199032B2Metal silicide induced lateral excessive encroachment reduction by silicon <110> channel stuffingTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 3, 2007·0 cites·23 claims
- 1141US4863558AMethod for etching tungstenTEXAS INSTRUMENTS INC·Filed 1988·Granted Sep 5, 1989·10 cites·6 claims
- 1240US6228741B1Method for trench isolation of semiconductor devicesTEXAS INSTRUMENTS INC·Filed 1999·Granted May 8, 2001·10 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →