Inventor · disambiguated record
Chu-Shik Kang
Also filed as: KANG CHU-SHIK
5 granted patents·1 pending application·15 citations·filing 2008–2014
70Inventor score
Top patents by PatentIndex Score
6 records- 0183US8279448B2Shape measurement apparatus and methodKIM JAE-WAN·Filed 2008·Granted Oct 2, 2012·12 cites·14 claims
- 0264US9121696B2Device and method for measuring via hole of silicon waferJIN JONG HAN·Filed 2011·Granted Sep 1, 2015·2 cites·10 claims
- 0362US9651403B2Absolute position measurement method, absolute position measurement apparatus and scaleKOREA RES INST STANDARDS & SCI·Filed 2014·Granted May 16, 2017·1 cites·29 claims
- 0450US9921051B2Thickness measuring apparatus and thickness measuring methodKOREA RES INST STANDARDS & SCI·Filed 2014·Granted Mar 20, 2018·0 cites·21 claims
- 0546US8290007B2Apparatus and method for stabilizing frequency of laserKIM JAE-WAN·Filed 2008·Granted Oct 16, 2012·0 cites·11 claims
- 0642US2015009509A1Transparent substrate monitoring apparatus and transparent substrate methodKOREA RES INST OF STANDARDS·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →