Inventor · disambiguated record
Yorinobu Kunimune
Also filed as: KUNIMUNE YORINOBU
9 granted patents·1 pending application·46 citations·filing 2003–2024
84Inventor score
Top patents by PatentIndex Score
10 records- 0185US9293457B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Mar 22, 2016·4 cites·8 claims
- 0284US7846830B2Semiconductor device and method for manufacturing sameNEC ELECTRONICS CORP·Filed 2007·Granted Dec 7, 2010·11 cites·7 claims
- 0380US7312535B2Semiconductor device having an anti-oxidizing layer that inhibits corrosion of an interconnect layerNEC ELECTRONICS CORP·Filed 2004·Granted Dec 25, 2007·26 cites·14 claims
- 0470US9356110B2Semiconductor device and manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2014·Granted May 31, 2016·2 cites·18 claims
- 0560US12327665B2Resistor material, resistor element and method of manufacturing the resistor elementRENESAS ELECTRONICS CORP·Filed 2022·Granted Jun 10, 2025·0 cites·14 claims
- 0657US2025046705A1Semiconductor device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0755US10074740B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Sep 11, 2018·0 cites·12 claims
- 0853US9722066B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2016·Granted Aug 1, 2017·0 cites·12 claims
- 0947US7687918B2Semiconductor device and method for manufacturing sameNEC ELECTRONICS CORP·Filed 2003·Granted Mar 30, 2010·3 cites·15 claims
- 1035US7309991B2Scanning probe inspection apparatusNEC ELECTRONICS CORP·Filed 2003·Granted Dec 18, 2007·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →