Inventor · disambiguated record
Yu-Ann Lai
Also filed as: LAI YU-ANN
2 granted patents·1 pending application·1 citations·filing 2020–2024
38Inventor score
Technology areasH10P
Files withTAIWAN SEMICONDUCTOR MFG CO LTD3
Top patents by PatentIndex Score
3 records- 0180US11680978B2GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 20, 2023·1 cites·20 claims
- 0275US2025060404A1Gan reliability built-in self test (bist) apparatus and method for qualifying dynamic on-state resistance degradationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0374US12163995B2GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 10, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →