Inventor · disambiguated record
Philippe Perdu
Also filed as: PERDU PHILIPPE
13 granted patents·4 pending applications·137 citations·filing 1999–2018
92Inventor score
Technology areasG01R
Top patents by PatentIndex Score
17 records- 0185US7439730B2Apparatus and method for detecting photon emissions from transistorsDCG SYSTEMS INC·Filed 2005·Granted Oct 21, 2008·10 cites·26 claims
- 0283US6967491B2Spatial and temporal selective laser assisted fault localizationCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 22, 2005·32 cites·48 claims
- 0382US7400154B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2005·Granted Jul 15, 2008·10 cites·37 claims
- 0481US6891363B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2002·Granted May 10, 2005·21 cites·23 claims
- 0577US7190822B2Method for customizing an integrated circuit elementCENTRE NAT ETD SPATIALES·Filed 2001·Granted Mar 13, 2007·21 cites·7 claims
- 0674US6943572B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2003·Granted Sep 13, 2005·15 cites·25 claims
- 0773US7038442B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2005·Granted May 2, 2006·5 cites·17 claims
- 0870US7323862B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2006·Granted Jan 29, 2008·4 cites·20 claims
- 0949US7408342B2Device for measuring a component of current based on magnetic fieldsCENTRE NAT ETD SPATIALES·Filed 2004·Granted Aug 5, 2008·5 cites·12 claims
- 1046US7417424B2Magnetic-field-measuring deviceCENTRE NAT ETD SPATIALES·Filed 2004·Granted Aug 26, 2008·4 cites·9 claims
- 1141US2011187352A1Method and machine for multidimensional testing of an electronic device on the basis of a monodirectional probeCENTRE NAT ETD SPATIALES·Filed 2009·Application pending·0 cites
- 1240US7411391B2Magnetic-field-measuring probeCENTRE NAT ETD SPATIALES·Filed 2004·Granted Aug 12, 2008·2 cites·14 claims
- 1339US2012116734A1Method of characterizing an electrical defect affecting an electronic circuit, related device and information recording mediumINFANTE FULVIO·Filed 2011·Application pending·0 cites
- 1439US2018336162A1Method and device for reconstructing a useful signal from a noisy acquired signalCENTRE NAT ETD SPATIALES·Filed 2018·Application pending·0 cites
- 1534US2005024057A1Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localizationFiled 2004·Application pending·0 cites
- 1633US6816614B1Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chipCENTRE NAT ETD SPATIALES·Filed 1999·Granted Nov 9, 2004·4 cites·21 claims
- 1732US6948107B1Method and installation for fast fault localization in an integrated circuitCENTRE NAT ETD SPATIALES·Filed 1999·Granted Sep 20, 2005·4 cites·35 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →