Inventor · disambiguated record
Romain Desplats
Also filed as: DESPLATS ROMAIN
23 granted patents·1 pending application·188 citations·filing 1999–2016
95Inventor score
Top patents by PatentIndex Score
24 records- 0185US7439730B2Apparatus and method for detecting photon emissions from transistorsDCG SYSTEMS INC·Filed 2005·Granted Oct 21, 2008·10 cites·26 claims
- 0283US6967491B2Spatial and temporal selective laser assisted fault localizationCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 22, 2005·32 cites·48 claims
- 0382US7400154B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2005·Granted Jul 15, 2008·10 cites·37 claims
- 0481US6891363B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2002·Granted May 10, 2005·21 cites·23 claims
- 0578US6552341B1Installation and method for microscopic observation of a semiconductor electronic circuitCENTRE NAT ETD SPATIALES·Filed 2000·Granted Apr 22, 2003·18 cites·7 claims
- 0677US7190822B2Method for customizing an integrated circuit elementCENTRE NAT ETD SPATIALES·Filed 2001·Granted Mar 13, 2007·21 cites·7 claims
- 0775US6526546B1Method for locating faulty elements in an integrated circuitCENTRE NAT ETD SPATIALES·Filed 2000·Granted Feb 25, 2003·21 cites·9 claims
- 0874US6943572B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2003·Granted Sep 13, 2005·15 cites·25 claims
- 0973US7038442B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2005·Granted May 2, 2006·5 cites·17 claims
- 1070US7323862B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2006·Granted Jan 29, 2008·4 cites·20 claims
- 1164US6970759B2Method and device for automatic optimal location of an operation on an integrated circuitCENTRE NAT ETD SPATIALES·Filed 2001·Granted Nov 29, 2005·6 cites·20 claims
- 1257US8344538B2Wind-powered device for producing electrical energyCENTRE NAT ETD SPATIALES·Filed 2007·Granted Jan 1, 2013·3 cites·9 claims
- 1356US7560940B2Method and installation for analyzing an integrated circuitCENTRE NAT ETD SPATIALES·Filed 2005·Granted Jul 14, 2009·3 cites·10 claims
- 1449US7408342B2Device for measuring a component of current based on magnetic fieldsCENTRE NAT ETD SPATIALES·Filed 2004·Granted Aug 5, 2008·5 cites·12 claims
- 1546US7417424B2Magnetic-field-measuring deviceCENTRE NAT ETD SPATIALES·Filed 2004·Granted Aug 26, 2008·4 cites·9 claims
- 1641US7692151B2Device for analyzing an integrated circuitCENTRE NAT ETD SPATIALES·Filed 2006·Granted Apr 6, 2010·0 cites·9 claims
- 1740US7411391B2Magnetic-field-measuring probeCENTRE NAT ETD SPATIALES·Filed 2004·Granted Aug 12, 2008·2 cites·14 claims
- 1834US8555728B2Method and installation for exposing the surface of an integrated circuitDESPLATS ROMAIN·Filed 2007·Granted Oct 15, 2013·0 cites·16 claims
- 1934US6844625B2Method for producing input/output permutation of several conductive strips with parallel branches of an integrated circuit and resulting circuitCENTRE NAT ETD SPATIALES·Filed 2001·Granted Jan 18, 2005·0 cites·14 claims
- 2034US2005024057A1Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localizationFiled 2004·Application pending·0 cites
- 2133US8326558B2Method of analyzing an integrated circuit, method of observation and their associated installationsDESPLATS ROMAIN·Filed 2007·Granted Dec 4, 2012·0 cites·22 claims
- 2233US6816614B1Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chipCENTRE NAT ETD SPATIALES·Filed 1999·Granted Nov 9, 2004·4 cites·21 claims
- 2332US6948107B1Method and installation for fast fault localization in an integrated circuitCENTRE NAT ETD SPATIALES·Filed 1999·Granted Sep 20, 2005·4 cites·35 claims
- 2430US10388148B2Method of controlling a calculation device via a mobile element and control system implementing this methodCENTRE NAT ETD SPATIALES·Filed 2016·Granted Aug 20, 2019·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →