Inventor · disambiguated record
Daniel Toet
Also filed as: TOET DANIEL
7 granted patents·5 pending applications·36 citations·filing 2000–2024
82Inventor score
Top patents by PatentIndex Score
12 records- 0192US11903302B2Organic vapor jet printing systemUNIVERSAL DISPLAY CORP·Filed 2021·Granted Feb 13, 2024·3 cites·33 claims
- 0287US7468611B2Continuous linear scanning of large flat panel mediaPHOTON DYNAMICS INC·Filed 2007·Granted Dec 23, 2008·14 cites·22 claims
- 0376US9523714B2Electrical inspection of electronic devices using electron-beam induced plasma probesPHOTON DYNAMICS INC·Filed 2014·Granted Dec 20, 2016·4 cites·45 claims
- 0474US12274155B2Organic vapor jet printing systemUNIVERSAL DISPLAY CORP·Filed 2024·Granted Apr 8, 2025·0 cites·20 claims
- 0563US6541316B2Process for direct integration of a thin-film silicon p-n junction diode with a magnetic tunnel junctionUNIV CALIFORNIA·Filed 2000·Granted Apr 1, 2003·9 cites·17 claims
- 0661US2023357918A1Organic vapor jet printing systemUNIVERSAL DISPLAY CORP·Filed 2023·Application pending·0 cites
- 0758US6933530B2Process for direct integration of a thin-film silicon p-n junction diode with a magnetic tunnel junctionUNIV CALIFORNIA·Filed 2004·Granted Aug 23, 2005·6 cites·12 claims
- 0855US2023363244A1Organic vapor jet printing systemUNIVERSAL DISPLAY CORP·Filed 2023·Application pending·0 cites
- 0950US2015097592A1Direct testing for peripheral circuits in flat panel devicesPHOTON DYNAMICS INC·Filed 2014·Application pending·0 cites
- 1040US2016299103A1Application of electron-beam induced plasma probes to inspection, test, debug and surface modificationsPHOTON DYNAMICS INC·Filed 2014·Application pending·0 cites
- 1137US6828180B2Process for direct integration of a thin-film silicon p-n junction diode with a magnetic tunnel junctionUNIV CALIFORNIA·Filed 2002·Granted Dec 7, 2004·0 cites·3 claims
- 1228US2017294291A1APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONSORBOTECH LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →