Inventor · disambiguated record
Ritsuro Orihashi
Also filed as: ORIHASHI RITSURO
20 granted patents·1 pending application·196 citations·filing 1985–2011
94Inventor score
Top patents by PatentIndex Score
21 records- 0193US7969197B2Output buffer circuit and differential output buffer circuit, and transmission methodHITACHI LTD·Filed 2010·Granted Jun 28, 2011·13 cites·8 claims
- 0285US5811877ASemiconductor device structureHITACHI LTD·Filed 1997·Granted Sep 22, 1998·84 cites·26 claims
- 0384US7476850B2Method and its apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 13, 2009·9 cites·21 claims
- 0474US7928365B2Method and apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 19, 2011·3 cites·6 claims
- 0568US7692445B2Output buffer circuit and differential output buffer circuit, and transmission methodHITACHI LTD·Filed 2007·Granted Apr 6, 2010·4 cites·9 claims
- 0668US7276900B2Magnetic characteristic inspecting apparatus and inspecting method using itHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 2, 2007·1 cites·18 claims
- 0761US7474290B2Semiconductor device and testing method thereofRENESAS TECH CORP·Filed 2004·Granted Jan 6, 2009·7 cites·4 claims
- 0861US5438259ADigital circuitry apparatusHITACHI LTD·Filed 1994·Granted Aug 1, 1995·35 cites·3 claims
- 0960US7443373B2Semiconductor device and the method of testing the sameRENESAS TECH CORP·Filed 2004·Granted Oct 28, 2008·6 cites·12 claims
- 1059US7358953B2Semiconductor device and testing method of semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Apr 15, 2008·6 cites·15 claims
- 1156US8324925B2Output buffer circuit and differential output buffer circuit, and transmission methodMURAOKA SATOSHI·Filed 2011·Granted Dec 4, 2012·1 cites·9 claims
- 1254US7668027B2Semiconductor device, testing and manufacturing methods thereofRENESAS TECH CORP·Filed 2006·Granted Feb 23, 2010·4 cites·12 claims
- 1353US7890074B2Data acquisition systemHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 15, 2011·0 cites·10 claims
- 1452US7990529B2Detection circuit and foreign matter inspection apparatus for semiconductor waferHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 2, 2011·0 cites·6 claims
- 1552US5406198ADigital circuitry apparatusHITACHI LTD·Filed 1993·Granted Apr 11, 1995·14 cites·3 claims
- 1648US7817362B2Inspection apparatus and inspection method of magnetic disk or magnetic headHITACHI LTD·Filed 2003·Granted Oct 19, 2010·1 cites·20 claims
- 1743US2011192970A1Method and apparatus for mass spectrometryOONISHI FUJIO·Filed 2011·Application pending·0 cites
- 1837US4755758AWave formatter for a logic circuit testing systemHITACHI LTD·Filed 1985·Granted Jul 5, 1988·6 cites·3 claims
- 1932US6768953B2Test apparatusHITACHI LTD·Filed 2002·Granted Jul 27, 2004·0 cites·7 claims
- 2032US6697755B2Test apparatusHITACHI LTD·Filed 2002·Granted Feb 24, 2004·0 cites·2 claims
- 2132US4855970ATime interval measurement apparatusHITACHI LTD·Filed 1987·Granted Aug 8, 1989·2 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →