Inventor · disambiguated record
Frederick W. Duewer
Also filed as: DUEWER FREDERICK W · DUEWER FREDERICK WILLIAM
10 granted patents·597 citations·filing 2003–2019
92Inventor score
Top patents by PatentIndex Score
10 records- 0198US7130375B1High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray sourceXRADIA INC·Filed 2005·Granted Oct 31, 2006·95 cites·18 claims
- 0297US8353628B1Method and system for tomographic projection correctionXRADIA INC·Filed 2009·Granted Jan 15, 2013·63 cites·23 claims
- 0397US7400704B1High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray sourceXRADIA INC·Filed 2006·Granted Jul 15, 2008·71 cites·15 claims
- 0496US8068579B1Process for examining mineral samples with X-ray microscope and projection systemsYUN WENBING·Filed 2009·Granted Nov 29, 2011·112 cites·29 claims
- 0595US7406151B1X-ray microscope with microfocus source and Wolter condenserXRADIA INC·Filed 2006·Granted Jul 29, 2008·63 cites·14 claims
- 0694US7394890B1Optimized x-ray energy for high resolution imaging of integrated circuits structuresXRADIA INC·Filed 2004·Granted Jul 1, 2008·85 cites·9 claims
- 0793US7443953B1Structured anode X-ray source for X-ray microscopyXRADIA INC·Filed 2006·Granted Oct 28, 2008·56 cites·22 claims
- 0889US7170969B1X-ray microscope capillary condenser systemXRADIA INC·Filed 2003·Granted Jan 30, 2007·47 cites·10 claims
- 0984US10772594B2Methods, systems, apparatuses, and computer program products for extending the field of view of a sensor and obtaining a synthetic radiagraphDENTSPLY SIRONA INC·Filed 2018·Granted Sep 15, 2020·4 cites·21 claims
- 1070US11026650B2Methods, systems, apparatuses, and computer program products for automatically determining exposure time for an intraoral imageDENTSPLY SIRONA INC·Filed 2019·Granted Jun 8, 2021·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →