Inventor · disambiguated record
Vahe Adamian
Also filed as: ADAMIAN VAHE · ADAMIAN VAHE A
17 granted patents·3 pending applications·997 citations·filing 1993–2011
96Inventor score
Top patents by PatentIndex Score
20 records- 0197US6653848B2Method and apparatus for linear characterization of multi-terminal single-ended or balanced devicesAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 25, 2003·198 cites·77 claims
- 0297US5578932AMethod and apparatus for providing and calibrating a multiport network analyzerATN MICROWAVE INC·Filed 1995·Granted Nov 26, 1996·226 cites·12 claims
- 0396US6920407B2Method and apparatus for calibrating a multiport test system for measurement of a DUTAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jul 19, 2005·171 cites·24 claims
- 0489US7030625B1Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurementAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 18, 2006·24 cites·22 claims
- 0589US5467021ACalibration method and apparatusATN MICROWAVE INC·Filed 1993·Granted Nov 14, 1995·51 cites·38 claims
- 0688US5552714AElectronic calibration method and apparatusATN MICROWAVE INC·Filed 1995·Granted Sep 3, 1996·54 cites·12 claims
- 0787US6826506B2Method and apparatus for calibrating a multiport test system for measurement of a DUTAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 30, 2004·32 cites·26 claims
- 0886US5434511AElectronic microwave calibration deviceATN MICROWAVE INC·Filed 1993·Granted Jul 18, 1995·60 cites·14 claims
- 0984US5548221AElectronic calibration method and apparatusATN MICROWAVE INC·Filed 1995·Granted Aug 20, 1996·40 cites·6 claims
- 1083US7157918B2Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device pathAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jan 2, 2007·11 cites·11 claims
- 1183US7068049B2Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibrationAGILENT TECHNOLOGIES INC·Filed 2003·Granted Jun 27, 2006·28 cites·5 claims
- 1281US5537046AElectronic calibration method and apparatusATN MICROWAVE INC·Filed 1995·Granted Jul 16, 1996·35 cites·13 claims
- 1378US6853198B2Method and apparatus for performing multiport through-reflect-line calibration and measurementAGILENT TECHNOLOGIES INC·Filed 2002·Granted Feb 8, 2005·24 cites·23 claims
- 1476US7019535B2Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device pathAGILENT TECHNOLOGIES INC·Filed 2002·Granted Mar 28, 2006·17 cites·27 claims
- 1571US6937032B2Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuitAGILENT TECHNOLOGIES INC·Filed 2004·Granted Aug 30, 2005·13 cites·29 claims
- 1664US6757625B2Method, apparatus, and article of manufacture for predicting electrical behavior of a multiport device having balanced device portsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Jun 29, 2004·11 cites·35 claims
- 1752US7126346B2Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuitsAGILENT TECHNOLOGIES INC·Filed 2003·Granted Oct 24, 2006·2 cites·21 claims
- 1844US2005091015A1Method and apparatus for modeling a uniform transmission lineFiled 2003·Application pending·0 cites
- 1939US2012109566A1Method and apparatus for calibrating a test system for measuring a device under testADAMIAN VAHE A·Filed 2011·Application pending·0 cites
- 2038US2011199107A1Method and apparatus for calibrating a test system for measuring a device under testATE SYSTEMS INC·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Vahe Adamian files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →