Inventor · disambiguated record
Jei-Wei Chang
Also filed as: CHANG JEI-WEI
67 granted patents·2 pending applications·1,318 citations·filing 1990–2017
99Inventor score
Top patents by PatentIndex Score
69 records- 0196US7285836B2Magnetic random access memory with stacked memory cells having oppositely-directed hard-axis biasingMAGLABS INC·Filed 2005·Granted Oct 23, 2007·57 cites·31 claims
- 0295US6292336B1Giant magnetoresistive (GMR) sensor element with enhanced magnetoresistive (MR) coefficientHEADWAY TECHNOLOGIES INC·Filed 1999·Granted Sep 18, 2001·116 cites·20 claims
- 0394US6322640B1Multiple thermal annealing method for forming antiferromagnetic exchange biased magnetoresistive (MR) sensor elementHEADWAY TECHNOLOGIES INC·Filed 2000·Granted Nov 27, 2001·59 cites·17 claims
- 0493US7453720B2Magnetic random access memory with stacked toggle memory cells having oppositely-directed easy-axis biasingMAGLABS INC·Filed 2005·Granted Nov 18, 2008·33 cites·26 claims
- 0593US6882509B2GMR configuration with enhanced spin filteringHEADWAY TECHNOLOGIES INC·Filed 2004·Granted Apr 19, 2005·32 cites·12 claims
- 0692US5132859AThin film structures for magnetic recording headsIBM·Filed 1990·Granted Jul 21, 1992·58 cites·33 claims
- 0791US6770382B1GMR configuration with enhanced spin filteringHEADWAY TECHNOLOGIES INC·Filed 1999·Granted Aug 3, 2004·63 cites·12 claims
- 0891US6430015B2Method of fabrication of striped magnetoresistive (SMR) and dual stripe magnetoresistive (DSMR) heads with anti-parallel exchange configurationHEADWAY TECHNOLOGIES INC·Filed 2001·Granted Aug 6, 2002·29 cites·20 claims
- 0991US5719730ALow fringe-field and narrow write-track magneto-resistive (MR) magnetic read-write headHEADWAY TECHNOLOGIES INC·Filed 1996·Granted Feb 17, 1998·83 cites·20 claims
- 1090US9118192B2Series/parallel connection scheme for energy storage devicesZHU LI-YAN·Filed 2011·Granted Aug 25, 2015·24 cites·32 claims
- 1190US7675718B2Narrow track CPP head with bias cancellationHEADWAY TECHNOLOGIES INC·Filed 2006·Granted Mar 9, 2010·8 cites·16 claims
- 1290US6776891B2Method of manufacturing an ultra high saturation moment soft magnetic thin filmHEADWAY TECHNOLOGIES INC·Filed 2001·Granted Aug 17, 2004·26 cites·14 claims
- 1390US6415500B1Method to prevent electrostatic discharge for MR/GMR wafer fabricationHEADWAY TECHNOLOGIES INC·Filed 2000·Granted Jul 9, 2002·34 cites·23 claims
- 1490US5763108AHigh saturtion magnetization material and magnetic head fabricated therefromHEADWAY TECHNOLOGIES INC·Filed 1997·Granted Jun 9, 1998·88 cites·18 claims
- 1588US7111386B2Lead plating method for GMR head manufactureHEADWAY TECHNOLOGIES INC·Filed 2005·Granted Sep 26, 2006·7 cites·8 claims
- 1686US6524491B1Double plate-up process for fabrication of composite magnetoresistive shared polesHEADWAY TECHNOLOGIES INC·Filed 1999·Granted Feb 25, 2003·49 cites·13 claims
- 1785US6524687B2Bilayer carbon overcoating for magnetic data storage disks and magnetic head/slider constructionsHEADWAY TECHNOLOGIES INC·Filed 2001·Granted Feb 25, 2003·16 cites·6 claims
- 1885US6204071B1Method of fabrication of striped magnetoresistive (SMR) and dual stripe magnetoresistive (DSMR) heads with anti-parallel exchange configurationHEADWAY TECHNOLOGIES INC·Filed 1999·Granted Mar 20, 2001·36 cites·14 claims
- 1985US5684658AHigh track density dual stripe magnetoresistive (DSMR) headHEADWAY TECHNOLOGIES INC·Filed 1996·Granted Nov 4, 1997·46 cites·16 claims
- 2084US7506430B2Process to manufacture narrow track CPP head with bias cancellationHEADWAY TECHNOLOGIES INC·Filed 2006·Granted Mar 24, 2009·4 cites·10 claims
- 2184US5582927AHigh magnetic moment materials and process for fabrication of thin film headsIBM·Filed 1994·Granted Dec 10, 1996·33 cites·54 claims
- 2283US7134184B2Process of manufacturing a narrow track CCP head with bias cancellationHEADWAY TECHNOLOGIES INC·Filed 2003·Granted Nov 14, 2006·12 cites·6 claims
- 2383US6393692B1Method of manufacture of a composite shared pole design for magnetoresistive merged headsHEADWAY TECHNOLOGIES INC·Filed 1999·Granted May 28, 2002·35 cites·22 claims
- 2483US6243939B1High ion beam etch selectivity for partial pole trim applicationHEADWAY TECHNOLOGIES INC·Filed 1999·Granted Jun 12, 2001·46 cites·19 claims
- 2583US5471092AMetallurgical joint including a stress release layerIBM·Filed 1994·Granted Nov 28, 1995·75 cites·25 claims
- 2680US9231271B2Merged battery cell with interleaved electrodesZHU LI-YAN·Filed 2012·Granted Jan 5, 2016·2 cites·24 claims
- 2779US5858182ABilayer carbon overcoating for magnetic data storage disks and magnetic head/slider constructionsHEADWAY TECHNOLOIES INC·Filed 1997·Granted Jan 12, 1999·32 cites·12 claims
- 2876US6560864B1Process for manufacturing a flat coilHEADWAY TECHNOLOGIES INC·Filed 2001·Granted May 13, 2003·19 cites·30 claims
- 2974US7192662B2Ultra high saturation moment soft magnetic thin filmHEADWAY TECHNOLOGIES INC·Filed 2004·Granted Mar 20, 2007·7 cites·7 claims
- 3074US6987650B2Device with thermoelectric coolingHEADWAY TECHNOLOGIES INC·Filed 2003·Granted Jan 17, 2006·10 cites·35 claims
- 3173US6239948B1Non-magnetic nickel containing conductor alloys for magnetic transducer element fabricationHEADWAY TECHNOLOGIES INC·Filed 1999·Granted May 29, 2001·23 cites·16 claims
- 3272US7132221B2Method to print photoresist lines with negative sidewallsHEADWAY TECHNOLOGIES INC·Filed 2003·Granted Nov 7, 2006·9 cites·18 claims
- 3371US6218080B1Plated flat metal gap for very narrow recording headsHEADWAY TECHNOLOGIES INC·Filed 2000·Granted Apr 17, 2001·8 cites·20 claims
- 3469US6291087B1Magnetoresistive (MR) sensor element with enhanced resistivity sensitivity and enhanced magnetic exchange biasHEADWAY TECHNOLOGIES INC·Filed 1999·Granted Sep 18, 2001·21 cites·15 claims
- 3568US6228276B1Method of manufacturing magnetoresistive (MR) sensor element with sunken lead structureHEADWAY TECHNOLOGIES INC·Filed 1999·Granted May 8, 2001·17 cites·3 claims
- 3666US7633712B2Method to print photoresist lines with negative sidewallsHEADWAY TECHNOLOGIES INC·Filed 2008·Granted Dec 15, 2009·1 cites·4 claims
- 3766US6885527B1Process to manufacture a top spin valveHEADWAY TECHNOLOGIES INC·Filed 2000·Granted Apr 26, 2005·7 cites·2 claims
- 3864US6973712B2Lead plating method for GMR head manufactureHEADWAY TECHNOLOGIES INC·Filed 2002·Granted Dec 13, 2005·4 cites·20 claims
- 3962US7118680B2Self-alignment scheme for enhancement of CPP-GMRHEADWAY TECHNOLOGIES INC·Filed 2003·Granted Oct 10, 2006·4 cites·14 claims
- 4062US6428714B1Protective layer for continuous GMR designHEADWAY TECHNOLOGIES INC·Filed 2000·Granted Aug 6, 2002·7 cites·20 claims
- 4161US6207350B1Corrosion inhibitor for NiCu for high performance writersHEADWAY TECHNOLOGIES INC·Filed 2000·Granted Mar 27, 2001·4 cites·5 claims
- 4259US6905811B2Method to form reduced dimension pattern with good edge roughnessHEADWAY TECHNOLOGIES INC·Filed 2003·Granted Jun 14, 2005·6 cites·30 claims
- 4356US9564669B2Merged battery cell with interleaved electrodesAMPEREX TECH LTD·Filed 2016·Granted Feb 7, 2017·0 cites·15 claims
- 4456US7134182B2Method to form an embedded micro-pedestal in a conductive layerHEADWAY TECHNOLOGIES INC·Filed 2003·Granted Nov 14, 2006·6 cites·9 claims
- 4556US6995959B2Integrated spin valve headHEADWAY TECHNOLOGIES INC·Filed 2004·Granted Feb 7, 2006·3 cites·10 claims
- 4656US6287476B1Electrochemical method to improve MR reader edge definition and device reliabilityHEADWAY TECHNOLOGIES INC·Filed 1999·Granted Sep 11, 2001·12 cites·17 claims
- 4754US7368227B2Method to print photoresist lines with negative sidewallsHEADWAY TECHNOLOGIES INC·Filed 2006·Granted May 6, 2008·0 cites·11 claims
- 4854US6627390B2Masking frame plating method for forming masking frame plated layerHEADWAY TECHNOLOGIES INC·Filed 2001·Granted Sep 30, 2003·2 cites·6 claims
- 4953US7012789B2Composite shared pole design for magnetoresistive merged headsHEADWAY TECHNOLOGIES INC·Filed 2002·Granted Mar 14, 2006·4 cites·14 claims
- 5053US6447689B1Protective layer for continuous GMR design using reverse photo maskHEADWAY TECHNOLOGIES INC·Filed 2000·Granted Sep 10, 2002·4 cites·20 claims
Showing the top 50 of 69 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →