Inventor · disambiguated record
Gordon A. Kelley, Jr.
Also filed as: KELLEY GORDON ARTHUR · KELLEY JR GORDON A · KELLEY JR GORDON ARTHUR
15 granted patents·2,355 citations·filing 1990–2002
96Inventor score
Files withIBM15
Top patents by PatentIndex Score
15 records- 0197US5561622AIntegrated memory cube structureIBM·Filed 1993·Granted Oct 1, 1996·250 cites·29 claims
- 0297US5270261AThree dimensional multichip package methods of fabricationIBM·Filed 1992·Granted Dec 14, 1993·332 cites·15 claims
- 0396US5563086AIntegrated memory cube, structure and fabricationIBM·Filed 1995·Granted Oct 8, 1996·195 cites·14 claims
- 0496US5502667AIntegrated multichip memory module structureIBM·Filed 1993·Granted Mar 26, 1996·291 cites·26 claims
- 0596US5202754AThree-dimensional multichip packages and methods of fabricationIBM·Filed 1991·Granted Apr 13, 1993·256 cites·6 claims
- 0694US5702984AIntegrated mulitchip memory module, structure and fabricationIBM·Filed 1996·Granted Dec 30, 1997·163 cites·20 claims
- 0794US4996587AIntegrated semiconductor chip packageIBM·Filed 1990·Granted Feb 26, 1991·350 cites·9 claims
- 0892US5426566AMultichip integrated circuit packages and systemsIBM·Filed 1993·Granted Jun 20, 1995·166 cites·21 claims
- 0990US6388198B1Coaxial wiring within SOI semiconductor, PCB to system for high speed operation and signal qualityIBM·Filed 1999·Granted May 14, 2002·95 cites·13 claims
- 1089US6943452B2Coaxial wiring within SOI semiconductor, PCB to system for high speed operation and signal qualityIBM·Filed 2002·Granted Sep 13, 2005·47 cites·4 claims
- 1183US5506753AMethod and apparatus for a stress relieved electronic moduleIBM·Filed 1994·Granted Apr 9, 1996·76 cites·31 claims
- 1279US5923181AMethods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip moduleIBM·Filed 1997·Granted Jul 13, 1999·41 cites·7 claims
- 1379US5309318AThermally enhanced semiconductor chip packageIBM·Filed 1993·Granted May 3, 1994·60 cites·25 claims
- 1471US5686843AMethods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip moduleIBM·Filed 1995·Granted Nov 11, 1997·30 cites·29 claims
- 1532US4999815ALow power addressing systemsIBM·Filed 1990·Granted Mar 12, 1991·3 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →