Inventor · disambiguated record
Hosei Nakahira
Also filed as: NAKAHIRA HOSEI
2 granted patents·2 pending applications·58 citations·filing 1999–2013
60Inventor score
Top patents by PatentIndex Score
4 records- 0177US6323952B1Flatness measuring apparatusNIKON CORP·Filed 1999·Granted Nov 27, 2001·56 cites·9 claims
- 0263US7981309B2Method for detecting polishing end in CMP polishing device, CMP polishing device, and semiconductor device manufacturing methodNIKON CORP·Filed 2006·Granted Jul 19, 2011·2 cites·12 claims
- 0352US2014049849A1Lens unit and image capturing apparatusNIKON CORP·Filed 2013·Application pending·0 cites
- 0447US2012194929A1Lens unit and image capturing apparatusNAKAHIRA HOSEI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →