Inventor · disambiguated record
Kazutaka Nimura
Also filed as: NIMURA KAZUTAKA
7 granted patents·60 citations·filing 2001–2014
83Inventor score
Top patents by PatentIndex Score
7 records- 0186US7034296B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2001·Granted Apr 25, 2006·24 cites·17 claims
- 0279US6963067B2Scanning electron microscope and sample observing method using itHITACHI SCIENCE SYSTEMS INC·Filed 2004·Granted Nov 8, 2005·20 cites·16 claims
- 0378US7800059B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 21, 2010·3 cites·6 claims
- 0473US7361894B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 22, 2008·6 cites·10 claims
- 0569US10204761B2Charged particle beam device, electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 12, 2019·2 cites·16 claims
- 0663US7164126B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2003·Granted Jan 16, 2007·5 cites·1 claims
- 0748US10269533B2Anti-contamination trap, and vacuum application deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 23, 2019·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →