Inventor · disambiguated record
Michael W. Cresswell
Also filed as: CRESSWELL MICHAEL · CRESSWELL MICHAEL W · CRESSWELL MICHAEL WILLIAM
23 granted patents·1,053 citations·filing 1975–1999
97Inventor score
Top patents by PatentIndex Score
23 records- 0193US5923041AOverlay target and measurement procedure to enable self-correction for wafer-induced tool-induced shift by imaging sensor meansUS COMMERCE·Filed 1995·Granted Jul 13, 1999·113 cites·8 claims
- 0293US5699282AMethods and test structures for measuring overlay in multilayer devicesUS COMMERCE·Filed 1996·Granted Dec 16, 1997·147 cites·20 claims
- 0390US5617340AMethod and reference standards for measuring overlay in multilayer structures, and for calibrating imaging equipment as used in semiconductor manufacturingUS COMMERCE·Filed 1995·Granted Apr 1, 1997·133 cites·36 claims
- 0488US5857258AElectrical test structure and method for measuring the relative locations of conductive features on an insulating substrateUS COMMERCE·Filed 1994·Granted Jan 12, 1999·133 cites·4 claims
- 0585US5602492AElectrical test structure and method for measuring the relative locations of conducting features on an insulating substrateUS COMMERCE·Filed 1994·Granted Feb 11, 1997·108 cites·3 claims
- 0682US4823136ATransmit-receive means for phased-array active antenna system using rf redundancyWESTINGHOUSE ELECTRIC CORP·Filed 1987·Granted Apr 18, 1989·59 cites·20 claims
- 0781US5218211ASystem for sampling the sizes, geometrical distribution, and frequency of small particles accumulating on a solid surfaceUS COMMERCE·Filed 1991·Granted Jun 8, 1993·47 cites·30 claims
- 0878US5920067AMonocrystalline test and reference structures, and use for calibrating instrumentsUS COMMERCE·Filed 1997·Granted Jul 6, 1999·43 cites·26 claims
- 0972US5383136AElectrical test structure and method for measuring the relative locations of conducting features on an insulating substrateUS COMMERCE·Filed 1992·Granted Jan 17, 1995·57 cites·6 claims
- 1071US5449953AMonolithic microwave integrated circuit on high resistivity siliconWESTINGHOUSE ELECTRIC CORP·Filed 1994·Granted Sep 12, 1995·44 cites·10 claims
- 1167US6146910ATarget configuration and method for extraction of overlay vectors from targets having concealed featuresUS COMMERCE·Filed 1999·Granted Nov 14, 2000·44 cites·10 claims
- 1255US4224083ADynamic isolation of conductivity modulation states in integrated circuitsWESTINGHOUSE ELECTRIC CORP·Filed 1978·Granted Sep 23, 1980·14 cites·12 claims
- 1354US5684301AMonocrystalline test structures, and use for calibrating instrumentsUS COMMERCE·Filed 1995·Granted Nov 4, 1997·21 cites·10 claims
- 1453US3990091ALow forward voltage drop thyristorWESTINGHOUSE ELECTRIC CORP·Filed 1975·Granted Nov 2, 1976·13 cites·6 claims
- 1550US4086127AMethod of fabricating apertured deposition masks used for fabricating thin film transistorsWESTINGHOUSE ELECTRIC CORP·Filed 1977·Granted Apr 25, 1978·7 cites·4 claims
- 1649US5004956AThin film electroluminescent edge emitter structure on a silcon substrateWESTINGHOUSE ELECTRIC CORP·Filed 1988·Granted Apr 2, 1991·11 cites·2 claims
- 1749US4894114AProcess for producing vias in semiconductorWESTINGHOUSE ELECTRIC CORP·Filed 1989·Granted Jan 16, 1990·15 cites·1 claims
- 1846US5043631AThin film electroluminescent edge emitter structure on a silicon substrateWESTINGHOUSE ELECTRIC CORP·Filed 1988·Granted Aug 27, 1991·9 cites·11 claims
- 1944US5247262ALinewidth micro-bridge test structureUS COMMERCE·Filed 1992·Granted Sep 21, 1993·15 cites·6 claims
- 2043US4043837ALow forward voltage drop thyristorWESTINGHOUSE ELECTRIC CORP·Filed 1976·Granted Aug 23, 1977·8 cites·4 claims
- 2137US4204116ALight activated switch system having high di/dt capabilityWESTINGHOUSE ELECTRIC CORP·Filed 1978·Granted May 20, 1980·3 cites·6 claims
- 2235US4904831AMitered mechanical switchesWESTINGHOUSE ELECTRIC CORP·Filed 1989·Granted Feb 27, 1990·7 cites·1 claims
- 2326US5373232AMethod of and articles for accurately determining relative positions of lithographic artifactsUS COMMERCE·Filed 1993·Granted Dec 13, 1994·2 cites·16 claims
Join the waitlist — get patent alerts
Get an alert when Michael W. Cresswell files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →