Inventor · disambiguated record
Vahid Bastani
Also filed as: BASTANI VAHID
6 granted patents·9 pending applications·3 citations·filing 2018–2023
70Inventor score
Files withASML NETHERLANDS BV15
Top patents by PatentIndex Score
15 records- 0182US11378891B2Method for determining contribution to a fingerprintASML NETHERLANDS BV·Filed 2020·Granted Jul 5, 2022·1 cites·20 claims
- 0279US10816904B2Method for determining contribution to a fingerprintASML NETHERLANDS BV·Filed 2018·Granted Oct 27, 2020·2 cites·26 claims
- 0367US2022342319A1Method for determining contribution to a fingerprintASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0455US2024402618A1Method of determining a performance parameter distributionASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0555US2025147436A1Methods of metrologyASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0654US12045555B2Method to label substrates based on process parametersASML NETHERLANDS BV·Filed 2019·Granted Jul 23, 2024·0 cites·21 claims
- 0751US11099485B2Maintaining a set of process fingerprintsASML NETHERLANDS BV·Filed 2018·Granted Aug 24, 2021·0 cites·20 claims
- 0849US11320743B2Method to label substrates based on process parametersASML NETHERLANDS BV·Filed 2019·Granted May 3, 2022·0 cites·20 claims
- 0947US2023341784A1Method and apparatus for identifying contamination in a semiconductor fabASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1046US12353967B2Method and apparatus for determining feature contribution to performanceASML NETHERLANDS BV·Filed 2020·Granted Jul 8, 2025·0 cites·20 claims
- 1146US2024346200A1A method of monitoring a lithographic process and associated apparatusesASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1244US2023153582A1Configuration of an imputer modelASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1343US2022291593A1Method and apparatus for lithographic process performance determinationASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 1442US2023316103A1Method for classifying semiconductor wafersASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1542US2024094640A1Method to predict metrology offset of a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →