Inventor · disambiguated record
Bi-Jen Chen
Also filed as: CHEN BI-JEN
3 granted patents·1 pending application·3 citations·filing 2009–2017
54Inventor score
Top patents by PatentIndex Score
4 records- 0171US10393801B2Fault isolation system and method for detecting faults in a circuitMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 27, 2019·3 cites·20 claims
- 0241US2010072400A1Method for cleaning a high resolution scanning electron microscope sample with a low power ion beamINOTERA MEMORIES INC·Filed 2009·Application pending·0 cites
- 0337US9784788B2Fault isolation system and method for detecting faults in a circuitMICRON TECHNOLOGY INC·Filed 2015·Granted Oct 10, 2017·0 cites·11 claims
- 0423US8426810B2Method of planar imaging on semiconductor chips using focused ion beamCHEN BI-JEN·Filed 2012·Granted Apr 23, 2013·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →