Inventor · disambiguated record
Jin-Mo Jang
Also filed as: JANG JIN-MO
4 granted patents·1 pending application·10 citations·filing 2002–2006
66Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
5 records- 0159US7423444B2Digital test apparatus for testing analog semiconductor device(s)SAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 9, 2008·2 cites·13 claims
- 0250US7268573B2Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under testSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 11, 2007·6 cites·16 claims
- 0337US6931349B2Jitter measuring system in high speed data output device and total jitter measuring methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Aug 16, 2005·2 cites·11 claims
- 0435US7610530B2Test data generator, test system and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 27, 2009·0 cites·31 claims
- 0526US2003187599A1Circuit for measuring rising or falling time of high-speed data and method thereofFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →