Inventor · disambiguated record
Edward E. Ehrichs
Also filed as: EHRICHS EDWARD · EHRICHS EDWARD E
13 granted patents·338 citations·filing 1997–2009
93Inventor score
Files withADVANCED MICRO DEVICES INC13
Top patents by PatentIndex Score
13 records- 0191US6794256B1Method for asymmetric spacer formationADVANCED MICRO DEVICES INC·Filed 2003·Granted Sep 21, 2004·62 cites·29 claims
- 0282US6593168B1Method and apparatus for accurate alignment of integrated circuit in flip-chip configurationADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 15, 2003·51 cites·37 claims
- 0381US6806111B1Semiconductor component and method of manufactureADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 19, 2004·33 cites·17 claims
- 0480US7144782B1Simplified masking for asymmetric haloADVANCED MICRO DEVICES INC·Filed 2004·Granted Dec 5, 2006·25 cites·20 claims
- 0575US7994037B2Gate dielectrics of different thickness in PMOS and NMOS transistorsADVANCED MICRO DEVICES INC·Filed 2009·Granted Aug 9, 2011·6 cites·20 claims
- 0673US6916716B1Asymmetric halo implantsADVANCED MICRO DEVICES INC·Filed 2003·Granted Jul 12, 2005·21 cites·28 claims
- 0769US6169960B1Method for determining the damage potential of the different types of wafer defectsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jan 2, 2001·37 cites·22 claims
- 0866US6943569B1Method, system and apparatus to detect defects in semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 13, 2005·11 cites·10 claims
- 0959US6522776B1Method for automated determination of reticle tilt in a lithographic systemADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 18, 2003·28 cites·27 claims
- 1056US6265314B1Wafer edge polishADVANCED MICRO DEVICES INC·Filed 1998·Granted Jul 24, 2001·23 cites·23 claims
- 1155US6156580ASemiconductor wafer analysis system and methodADVANCED MICRO DEVICES INC·Filed 1998·Granted Dec 5, 2000·21 cites·18 claims
- 1254US6401008B1Semiconductor wafer review system and methodADVANCED MICRO DEVICES INC·Filed 1998·Granted Jun 4, 2002·20 cites·29 claims
- 1341US7223615B2High emissivity capacitor structureADVANCED MICRO DEVICES INC·Filed 2003·Granted May 29, 2007·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →