Inventor · disambiguated record
Yiqiang Chen
Also filed as: CHEN YIQIANG
13 granted patents·2 pending applications·9 citations·filing 2013–2025
83Inventor score
Files withFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH6CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON3CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES2FIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY1HUAWEI TECH CO LTD1
Top patents by PatentIndex Score
15 records- 0176US10732216B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2018·Granted Aug 4, 2020·2 cites·4 claims
- 0271US9952275B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2013·Granted Apr 24, 2018·3 cites·3 claims
- 0369US9329228B2Prognostic circuit of electromigration failure for integrated circuitFIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY·Filed 2013·Granted May 3, 2016·4 cites·9 claims
- 0467US12066468B1Method and device for detecting system failure, computer device, and storage mediumCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2024·Granted Aug 20, 2024·0 cites·20 claims
- 0565US2024425394A1Composite ozone catalyst, preparation method and use thereofJIANGSU ENVIRONMENTAL ENGINEERING TECH CO LTD·Filed 2024·Application pending·0 cites
- 0662US12301097B2Fault prediction method and apparatus for power conversion device, and power conversion systemCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2023·Granted May 13, 2025·0 cites·10 claims
- 0757US12339310B1Method for monitoring degradation mechanism of switch device in power conversion circuitCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Granted Jun 24, 2025·0 cites·8 claims
- 0852US12340593B2Vehicle drivable area detection method, system, and autonomous vehicle using the systemSHENZHEN YINWANG INTELLIGENT TECHNOLOGY CO LTD·Filed 2022·Granted Jun 24, 2025·0 cites·17 claims
- 0950US12241948B2Asymmetric compensation method and apparatus for two-port near field probe, computer device, and storage mediumCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2024·Granted Mar 4, 2025·0 cites·11 claims
- 1049US12494384B1Chip defect modifying device and methodCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Granted Dec 9, 2025·0 cites·3 claims
- 1148US2022414917A1Method and apparatus for obtaining 3d information of vehicleHUAWEI TECH CO LTD·Filed 2022·Application pending·0 cites
- 1237US11231702B2Method, device and system for health monitoring of system-on-chipFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Jan 25, 2022·0 cites·8 claims
- 1334US10598713B2ESD failure early warning circuit for integrated circuitFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Mar 24, 2020·0 cites·11 claims
- 1433US10458823B2System and method for health monitoring and early warning for electronic deviceFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Oct 29, 2019·0 cites·8 claims
- 1531US10503578B2On-chip TDDB degradation monitoring and failure early warning circuit for SoCFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Dec 10, 2019·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →