Inventor · disambiguated record
Mitsunobu Isobe
Also filed as: ISOBE MITSUNOBU
9 granted patents·2 pending applications·240 citations·filing 1979–2007
90Inventor score
Top patents by PatentIndex Score
11 records- 0189US4244539APerfect layer coil winding apparatusHITACHI LTD·Filed 1979·Granted Jan 13, 1981·39 cites·4 claims
- 0287US5430548AMethod and apparatus for pattern detectionHITACHI LTD·Filed 1993·Granted Jul 4, 1995·70 cites·7 claims
- 0379US7269280B2Method and its apparatus for inspecting a patternHITACHI LTD·Filed 2002·Granted Sep 11, 2007·22 cites·26 claims
- 0475US6566671B1Microscopic defect inspection apparatus and method thereof, as well as positional shift calculation circuit thereforHITACHI LTD·Filed 2000·Granted May 20, 2003·13 cites·41 claims
- 0567US6831998B1Inspection system for circuit patterns and a method thereofHITACHI LTD·Filed 2000·Granted Dec 14, 2004·26 cites·8 claims
- 0661US5018219AObject recognize apparatusHITACHI LTD·Filed 1989·Granted May 21, 1991·34 cites·4 claims
- 0747US2008002876A1Method and its apparatus for inspecting a patternHIROI TAKASHI·Filed 2007·Application pending·0 cites
- 0845US7049587B2Apparatus for inspecting a specimenHITACHI LTD·Filed 2002·Granted May 23, 2006·2 cites·20 claims
- 0945US5125044AImage processing apparatus and method in which a plurality of access circuits can simultaneously perform access operationsHITACHI LTD·Filed 1991·Granted Jun 23, 1992·11 cites·2 claims
- 1044US5144683ACharacter recognition equipmentHITACHI LTD·Filed 1990·Granted Sep 1, 1992·23 cites·44 claims
- 1138US2007131877A9Pattern inspection method and system thereforHIROI TAKASHI·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →