Inventor · disambiguated record
Te-Yi Yu
Also filed as: YU TE-YI
2 granted patents·2 citations·filing 2011–2012
34Inventor score
Technology areasG11C
Top patents by PatentIndex Score
2 records- 0149US8331178B2Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory deviceLIU SHI-HUEI·Filed 2011·Granted Dec 11, 2012·2 cites·18 claims
- 0221US8773931B2Method of detecting connection defects of memory and memory capable of detecting connection defects thereofCHANG MIN-CHIH·Filed 2012·Granted Jul 8, 2014·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →