Inventor · disambiguated record
Justin Lach
Also filed as: LACH JUSTIN
2 granted patents·1 pending application·0 citations·filing 2021–2022
22Inventor score
Files withKLA CORP3
Top patents by PatentIndex Score
3 records- 0153US12422376B2Imaging reflectometry for inline screeningKLA CORP·Filed 2021·Granted Sep 23, 2025·0 cites·44 claims
- 0253US12332182B2System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test dataKLA CORP·Filed 2022·Granted Jun 17, 2025·0 cites·42 claims
- 0342US2022196723A1System and method for automatically identifying defect-based test coverage gaps in semiconductor devicesKLA CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →