Inventor · disambiguated record
Ralf Friedrich
Also filed as: FRIEDRICH RALF
10 granted patents·7 pending applications·37 citations·filing 1998–2021
85Inventor score
Top patents by PatentIndex Score
17 records- 0176US7348536B2Light grid with housingSICK AG·Filed 2005·Granted Mar 25, 2008·17 cites·7 claims
- 0258US11460342B2Fastening system for fastening an optoelectronic measuring device, in particular a light grid, in an operating positionSICK AG·Filed 2021·Granted Oct 4, 2022·0 cites·12 claims
- 0357US9291303B2Method of fastening and adjusting a light grid housingSICK AG·Filed 2013·Granted Mar 22, 2016·1 cites·5 claims
- 0450USD984913SOptoelectronic sensorSICK AG·Filed 2021·Granted May 2, 2023·2 cites·1 claims
- 0549US7623698B2Method of learning a knowledge-based database used in automatic defect classificationKLA TENCOR MIE GMBH·Filed 2004·Granted Nov 24, 2009·3 cites·14 claims
- 0647US7085471B2Light barrierSICK AG·Filed 2005·Granted Aug 1, 2006·3 cites·15 claims
- 0747US2008152820A1Detachable Protecting FilmsBASF AG·Filed 2006·Application pending·0 cites
- 0845US2009292390A1Operating device for operating a machine toolSIEMENS AG·Filed 2009·Application pending·0 cites
- 0944US2005209117A1Complexing agent for treating metallic and plastic surfacesBASF AG·Filed 2003·Application pending·0 cites
- 1042US2009046066A1Operating device for operating a machine tool, a production machine and/or a machine in the form of a robotSIEMENS AG·Filed 2008·Application pending·0 cites
- 1140US8090185B2Method for optical inspection, detection and visualization of defects on disk-shaped objectsFRIEDRICH RALF·Filed 2008·Granted Jan 3, 2012·0 cites·20 claims
- 1237USD765529SOptoelectronic sensorsSICK AG·Filed 2015·Granted Sep 6, 2016·2 cites·1 claims
- 1336US2005192684A1Device for automating machine tools or production machinesSIEMENS AG·Filed 2004·Application pending·0 cites
- 1434USD734193SOptoelectronic sensorsSICK AG·Filed 2013·Granted Jul 14, 2015·2 cites·1 claims
- 1534US2005201086A1Protective light barrierSICK AG·Filed 2005·Application pending·0 cites
- 1631US2008208523A1Method of determining geometric parameters of a waferVISTEC SEMICONDUCTOR SYS GMBH·Filed 2008·Application pending·0 cites
- 1728US6529795B1Numerical control for machine-tools, robots or the likeSIEMENS AG·Filed 1998·Granted Mar 4, 2003·7 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →