Inventor · disambiguated record
Teodor Gotszalk
Also filed as: GOTSZALK TEODOR
2 granted patents·17 citations·filing 2008–2008
57Inventor score
Technology areasG01Q
Top patents by PatentIndex Score
2 records- 0180US8056402B2Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniquesHECKER MICHAEL·Filed 2008·Granted Nov 15, 2011·14 cites·8 claims
- 0252US8689359B2Apparatus and method for investigating surface properties of different materialsRANGELOW IVO W·Filed 2008·Granted Apr 1, 2014·3 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →