Inventor · disambiguated record
Sang-Ah Hyun
Also filed as: HYUN SANG-AH
27 granted patents·1 pending application·34 citations·filing 2013–2023
93Inventor score
Files withSK HYNIX INC28
Top patents by PatentIndex Score
28 records- 0189US9646676B1Semiconductor devices and semiconductor systems including the sameSK HYNIX INC·Filed 2016·Granted May 9, 2017·10 cites·26 claims
- 0285US9620195B1Memory deviceSK HYNIX INC·Filed 2016·Granted Apr 11, 2017·7 cites·22 claims
- 0382US11293972B2Semiconductor device, test method, and system including the sameSK HYNIX INC·Filed 2020·Granted Apr 5, 2022·1 cites·12 claims
- 0471US9390815B1Semiconductor system and method for testing semiconductor deviceSK HYNIX INC·Filed 2015·Granted Jul 12, 2016·3 cites·26 claims
- 0571US9349430B2Memory device and memory system including the sameSK HYNIX INC·Filed 2014·Granted May 24, 2016·3 cites·25 claims
- 0670US12400701B2Memory device for performing smart refresh operation and method of reducing power consumption during refreshSK HYNIX INC·Filed 2023·Granted Aug 26, 2025·0 cites·12 claims
- 0768US10762950B2Buffer control circuit of memory deviceSK HYNIX INC·Filed 2018·Granted Sep 1, 2020·2 cites·22 claims
- 0866US10446199B2Semiconductor device and semiconductor systemSK HYNIX INC·Filed 2017·Granted Oct 15, 2019·3 cites·23 claims
- 0966US9941020B2Semiconductor system and method for testing semiconductor deviceSK HYNIX INC·Filed 2016·Granted Apr 10, 2018·2 cites·14 claims
- 1065US10008252B2Semiconductor system capable of storing different setting information in plurality of semiconductor chips sharing command/address informationSK HYNIX INC·Filed 2017·Granted Jun 26, 2018·2 cites·26 claims
- 1162US9689750B2Temperature sensorsSK HYNIX INC·Filed 2014·Granted Jun 27, 2017·1 cites·9 claims
- 1261US11881246B2Memory device for performing smart refresh operation and memory system including the sameSK HYNIX INC·Filed 2021·Granted Jan 23, 2024·0 cites·11 claims
- 1361US10679913B2Semiconductor device, test method, and system including the sameSK HYNIX INC·Filed 2017·Granted Jun 9, 2020·0 cites·22 claims
- 1458US12159681B2Test systems configured to perform test mode operations for multiple memory devicesSK HYNIX INC·Filed 2023·Granted Dec 3, 2024·0 cites·36 claims
- 1557US10481015B2Temperature sensorsSK HYNIX INC·Filed 2017·Granted Nov 19, 2019·0 cites·9 claims
- 1656US11257561B2Memory device and test method thereofSK HYNIX INC·Filed 2020·Granted Feb 22, 2022·0 cites·10 claims
- 1751US9008160B2Transmitting/receiving circuit and transmitting/receiving system including the sameSK HYNIX INC·Filed 2013·Granted Apr 14, 2015·0 cites·20 claims
- 1850US9191153B2Transmitter/receiver for supporting differential signaling and semiconductor transmitter/receiver system including the sameSK HYNIX INC·Filed 2014·Granted Nov 17, 2015·0 cites·19 claims
- 1948US9454162B2Calibration circuit and semiconductor device including the sameSK HYNIX INC·Filed 2014·Granted Sep 27, 2016·0 cites·8 claims
- 2046US10636508B2Memory device and test method thereofSK HYNIX INC·Filed 2018·Granted Apr 28, 2020·0 cites·19 claims
- 2145US9627025B2Memory device and memory system including the sameSK HYNIX INC·Filed 2016·Granted Apr 18, 2017·0 cites·8 claims
- 2242US9048845B2Semiconductor systemSK HYNIX INC·Filed 2013·Granted Jun 2, 2015·0 cites·23 claims
- 2341US9524768B1Control circuit and memory device including the sameSK HYNIX INC·Filed 2016·Granted Dec 20, 2016·0 cites·19 claims
- 2440US9337808B2Semiconductor devices and semiconductor systems including the sameSK HYNIX INC·Filed 2014·Granted May 10, 2016·0 cites·20 claims
- 2537US10037793B2Semiconductor memory device and method for operating the sameSK HYNIX INC·Filed 2017·Granted Jul 31, 2018·0 cites·17 claims
- 2637US9373374B2Semiconductor apparatus capable of self-tuning a timing marginSK HYNIX INC·Filed 2015·Granted Jun 21, 2016·0 cites·30 claims
- 2737US2015100814A1Semiconductor device and semiconductor systems including the sameSK HYNIX INC·Filed 2013·Application pending·0 cites
- 2833US10580474B2Semiconductor devicesSK HYNIX INC·Filed 2017·Granted Mar 3, 2020·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →