Inventor · disambiguated record
Lukas E. Howald
Also filed as: HOWALD LUKAS · HOWALD LUKAS E · HOWALD LUKAS EMANUEL
4 granted patents·30 citations·filing 2000–2015
71Inventor score
Top patents by PatentIndex Score
4 records- 0167US9448393B2Method and apparatus for automated scanning probe microscopyNuomedis AG·Filed 2015·Granted Sep 20, 2016·3 cites·14 claims
- 0259US6767696B2Scanning tip and process for its production and use, particularly for a scanning probe microscopeNANOSURF AG·Filed 2001·Granted Jul 27, 2004·23 cites·15 claims
- 0336US7759631B2Raster scanning microscope having transparent optical element with inner curved surfaceNANOSURF AG·Filed 2008·Granted Jul 20, 2010·0 cites·20 claims
- 0435US6525316B1Multiaxis actuator and measuring head, especially for a scanning probe microscopeNANOSURF AG·Filed 2000·Granted Feb 25, 2003·4 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →