Inventor · disambiguated record
Seung-Jin Seo
Also filed as: SEO SEUNG-JIN
17 granted patents·5 pending applications·129 citations·filing 1996–2013
93Inventor score
Top patents by PatentIndex Score
22 records- 0183US7519873B2Methods and apparatus for interfacing between test system and memorySAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 14, 2009·13 cites·25 claims
- 0282US7965530B2Memory modules and memory systems having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jun 21, 2011·14 cites·11 claims
- 0379US7487413B2Memory module testing apparatus and method of testing memory modulesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 3, 2009·7 cites·25 claims
- 0478US8159853B2Memory module cutting off DM pad leakage currentKIM SEOK-IL·Filed 2010·Granted Apr 17, 2012·6 cites·16 claims
- 0577US7447954B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 4, 2008·8 cites·19 claims
- 0677US5768173AMemory modules, circuit substrates and methods of fabrication therefor using partially defective memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jun 16, 1998·51 cites·17 claims
- 0776US7849373B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Dec 7, 2010·2 cites·10 claims
- 0865US9320147B2Semiconductor module assemblySAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Apr 19, 2016·2 cites·14 claims
- 0964US8051343B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Nov 1, 2011·2 cites·15 claims
- 1063US8576637B2Memory module including memory buffer and memory system having the sameJANG SOON-DEOK·Filed 2010·Granted Nov 5, 2013·4 cites·19 claims
- 1161US7606110B2Memory module, memory unit, and hub with non-periodic clock and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 20, 2009·5 cites·20 claims
- 1258US7319635B2Memory system with registered memory module and control methodSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 15, 2008·5 cites·33 claims
- 1349US6754112B2Integrated circuit devices having delay circuits for controlling setup/delay times of data signals that are provided to memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 22, 2004·6 cites·13 claims
- 1444US7539910B2Memory module test system for memory module including hubSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 26, 2009·4 cites·11 claims
- 1544US2005289287A1Method and apparatus for interfacing between test system and embedded memory on test mode setting operationSHIN SEUNG-MAN·Filed 2005·Application pending·0 cites
- 1644US2013279916A1Server system and method of performing memory hierarchy control in server systemSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1743US2010169725A1Memory module testerSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 1842US8462534B2Memory module cutting off DM pad leakage currentKIM SEOK-IL·Filed 2012·Granted Jun 11, 2013·0 cites·15 claims
- 1941US8261301B2Broadcast receiver and method for managing reserved recording informationKANG SUNG SUK·Filed 2006·Granted Sep 4, 2012·0 cites·23 claims
- 2040US2012218703A1Circuit Board Assemblies and Data Processing Systems Including the SameCHO JEONG HYEON·Filed 2011·Application pending·0 cites
- 2134US7930465B2Determining operation mode for semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 19, 2011·0 cites·18 claims
- 2232US2006064611A1Method of testing memory module and memory moduleSHIN SEUNG-MAN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →