Inventor · disambiguated record
Akira Ide
Also filed as: IDE AKIRA
67 granted patents·7 pending applications·574 citations·filing 1975–2020
99Inventor score
Top patents by PatentIndex Score
74 records- 0194US10432158B1Apparatuses and methods for a chopper instrumentation amplifierMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 1, 2019·10 cites·16 claims
- 0293US8687444B2Semiconductor device and manufacturing method thereofIDE AKIRA·Filed 2011·Granted Apr 1, 2014·20 cites·16 claims
- 0393US8350389B2Semiconductor device and information processing system including the sameELPIDA MEMORY INC·Filed 2010·Granted Jan 8, 2013·15 cites·22 claims
- 0492US8735288B2Semiconductor device and information processing system including the sameELPIDA MEMORY INC·Filed 2013·Granted May 27, 2014·12 cites·16 claims
- 0592US8644086B2Semiconductor device having optical fuse and electrical fuseIDE AKIRA·Filed 2011·Granted Feb 4, 2014·12 cites·26 claims
- 0691US8924903B2Semiconductor device having plural memory chipIDE AKIRA·Filed 2011·Granted Dec 30, 2014·10 cites·8 claims
- 0791US8593899B2Semiconductor device, information processing system including same, and controller for controlling semiconductor deviceIDE AKIRA·Filed 2011·Granted Nov 26, 2013·10 cites·16 claims
- 0891US8310382B2Semiconductor device having plural semiconductor chips laminated to each otherIDE AKIRA·Filed 2010·Granted Nov 13, 2012·15 cites·19 claims
- 0990US10468386B1TSV redundancy and TSV test select schemeMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 5, 2019·6 cites·19 claims
- 1088US8619486B2Semiconductor memory device incorporating an interface chip for selectively refreshing memory cells in core chipsHAYASHI JUNICHI·Filed 2011·Granted Dec 31, 2013·10 cites·28 claims
- 1187US8981558B2Semiconductor deviceIDE AKIRA·Filed 2012·Granted Mar 17, 2015·9 cites·20 claims
- 1287US4729882AProcess for cleaning mercury-containing gaseous emissionsTOKYO METROPOL ENVIRON SERV·Filed 1985·Granted Mar 8, 1988·80 cites·6 claims
- 1386US8461690B2Semiconductor device capable of suppressing generation of cracks in semiconductor chip during manufacturing processYOSHIDA MASANORI·Filed 2010·Granted Jun 11, 2013·11 cites·22 claims
- 1484US7202618B2Inverter deviceTOYOTA JIDOSHOKKI KK·Filed 2005·Granted Apr 10, 2007·17 cites·8 claims
- 1582US9252062B2Semiconductor device having optical fuse and electrical fusePS4 LUXCO SARL·Filed 2014·Granted Feb 2, 2016·4 cites·15 claims
- 1682US8765526B2Method of manufacturing semiconductor device including plural semiconductor chips stacked togetherIDE AKIRA·Filed 2011·Granted Jul 1, 2014·6 cites·10 claims
- 1782US8498831B2Semiconductor device, semiconductor device testing method, and data processing systemIDE AKIRA·Filed 2010·Granted Jul 30, 2013·10 cites·45 claims
- 1881US9252091B2Semiconductor device having penetrating electrodes each penetrating through semiconductor chipPS4 LUXCO SARL·Filed 2013·Granted Feb 2, 2016·5 cites·14 claims
- 1981US8633593B2Semiconductor deviceIDE AKIRA·Filed 2012·Granted Jan 21, 2014·4 cites·20 claims
- 2080US10797033B2Apparatuses and methods for high sensitivity TSV resistance measurement circuitMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 6, 2020·2 cites·21 claims
- 2179US9136204B2Semiconductor device having penetrating electrodes each penetrating through substratePS4 LUXCO SARL·Filed 2013·Granted Sep 15, 2015·5 cites·8 claims
- 2279US8031001B2Differential amplifier, reference voltage generating circuit, differential amplifying method, and reference voltage generating methodELPIDA MEMORY INC·Filed 2009·Granted Oct 4, 2011·10 cites·8 claims
- 2379US4883988ACurrent mirror switching circuitHITACHI LTD·Filed 1988·Granted Nov 28, 1989·22 cites·6 claims
- 2478US10797664B2Apparatuses and methods for a chopper instrumentation amplifierMICRON TECHNOLOGY INC·Filed 2019·Granted Oct 6, 2020·2 cites·14 claims
- 2578US8817559B2Semiconductor device and manufacturing method thereofIDE AKIRA·Filed 2012·Granted Aug 26, 2014·5 cites·13 claims
- 2677US7903492B2Semiconductor deviceELPIDA MEMORY INC·Filed 2008·Granted Mar 8, 2011·6 cites·20 claims
- 2777US5398318AHigh speed, low noise output buffer with non-identical pairs of output transistorsHITACHI LTD·Filed 1990·Granted Mar 14, 1995·26 cites·28 claims
- 2876US8294449B2Bandgap reference circuit and method of starting bandgap reference circuitIDE AKIRA·Filed 2009·Granted Oct 23, 2012·8 cites·17 claims
- 2974US9252081B2Semiconductor device having plural memory chipPS4 LUXCO SARL·Filed 2014·Granted Feb 2, 2016·2 cites·11 claims
- 3073US8737123B2Semiconductor device, information processing system including same, and controller for controlling semiconductor deviceELPIDA MEMORY INC·Filed 2013·Granted May 27, 2014·2 cites·7 claims
- 3171US8604621B2Semiconductor device and information processing system including the sameELPIDA MEMORY INC·Filed 2012·Granted Dec 10, 2013·2 cites·20 claims
- 3269US8952498B2Semiconductor device having plural stacked chipsSHIGEZANE YASUYUKI·Filed 2012·Granted Feb 10, 2015·4 cites·19 claims
- 3368US9766646B2Constant current source circuitPS4 LUXCO SARL·Filed 2015·Granted Sep 19, 2017·1 cites·14 claims
- 3468US4984207ASemiconductor memory deviceHITACHI LTD·Filed 1990·Granted Jan 8, 1991·29 cites·44 claims
- 3568US4314048AAliphatic triisocyanate, a method for preparing it and the preparation of polyurethane resins therewithASAHI CHEMICAL IND·Filed 1981·Granted Feb 2, 1982·17 cites·5 claims
- 3667US11315917B2Apparatuses and methods for high sensitivity TSV resistance measurement circuitMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 26, 2022·0 cites·20 claims
- 3766US7859339B2Differential amplification circuitELPIDA MEMORY INC·Filed 2008·Granted Dec 28, 2010·5 cites·18 claims
- 3865US7750712B2Timing control circuit, timing generation system, timing control method and semiconductor memory deviceELPIDA MEMORY INC·Filed 2008·Granted Jul 6, 2010·5 cites·19 claims
- 3965US6717833B2Semiconductor deviceHITACHI LTD·Filed 2000·Granted Apr 6, 2004·12 cites·17 claims
- 4064US7772911B2Timing control circuit and semiconductor storage deviceELPIDA MEMORY INC·Filed 2008·Granted Aug 10, 2010·4 cites·16 claims
- 4163US5387827ASemiconductor integrated circuit having logic gatesHITACHI LTD·Filed 1991·Granted Feb 7, 1995·13 cites·43 claims
- 4263US4028392AIsocyanate prepolymersASAHI CHEMICAL IND·Filed 1975·Granted Jun 7, 1977·13 cites·6 claims
- 4361US9171588B2Semiconductor device capable of performing a read leveling and a write leveling based on an ambient temperatureMICRON TECHNOLOGY INC·Filed 2014·Granted Oct 27, 2015·2 cites·20 claims
- 4460US11990852B2Control device for electric motorTOYOTA JIDOSHOKKI KK·Filed 2020·Granted May 21, 2024·0 cites·2 claims
- 4560US4176132AReaction of organic diisocyanates with waterASAHI CHEMICAL IND·Filed 1978·Granted Nov 27, 1979·12 cites·22 claims
- 4658US5680066ASignal transition detector circuitHITACHI LTD·Filed 1994·Granted Oct 21, 1997·15 cites·51 claims
- 4756US9117829B2Semiconductor device including guard ring and groovePS4 LUXCO SARL·Filed 2013·Granted Aug 25, 2015·0 cites·10 claims
- 4856US8138743B2Band-gap reference voltage source circuit with switchable bias voltageIDE AKIRA·Filed 2009·Granted Mar 20, 2012·3 cites·20 claims
- 4956US5619151ASemiconductor deviceHITACHI LTD·Filed 1995·Granted Apr 8, 1997·14 cites·37 claims
- 5055US10037971B2Semiconductor device having plural memory chipPS4 LUXCO SARL·Filed 2016·Granted Jul 31, 2018·0 cites·9 claims
Showing the top 50 of 74 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →