Inventor · disambiguated record
Trent W. Johnson
Also filed as: JOHNSON TRENT · JOHNSON TRENT W · JOHNSON TRENT WILLIAM
9 granted patents·2 pending applications·77 citations·filing 2004–2018
84Inventor score
Top patents by PatentIndex Score
11 records- 0191US7519880B1Burn-in using system-level test hardwareADVANCED MICRO DEVICES INC·Filed 2005·Granted Apr 14, 2009·49 cites·18 claims
- 0268US10114696B2Tracking data access in a dispersed storage networkIBM·Filed 2016·Granted Oct 30, 2018·1 cites·20 claims
- 0368US7404110B1Method and system for self-assembling instruction opcodes for a custom random functional test of a microprocessorADVANCED MICRO DEVICES INC·Filed 2004·Granted Jul 22, 2008·15 cites·21 claims
- 0462US7254509B1Method and system for testing a memory of a microprocessorADVANCED MICRO DEVICES INC·Filed 2004·Granted Aug 7, 2007·11 cites·14 claims
- 0562US2017249228A1Persistent device fault indicatorsIBM·Filed 2017·Application pending·0 cites
- 0657US10169369B2Meeting storage requirements with limited storage resourcesIBM·Filed 2017·Granted Jan 1, 2019·0 cites·20 claims
- 0756US11237904B2Tracking data access in a dispersed storage networkIBM·Filed 2018·Granted Feb 1, 2022·0 cites·20 claims
- 0856US11132340B2Storage unit selection of memory devices used for distributed storage network memoryIBM·Filed 2018·Granted Sep 28, 2021·0 cites·19 claims
- 0953US7873824B2Method and apparatus for remote BIOS configuration controlADVANCED MICRO DEVICES INC·Filed 2007·Granted Jan 18, 2011·1 cites·29 claims
- 1052US10831378B2Optimizing data access in a DSN memory for wear levelingIBM·Filed 2018·Granted Nov 10, 2020·0 cites·14 claims
- 1140US2015109015A1System-level testing of non-singulated integrated circuit die on a waferATI TECHNOLOGIES ULC·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →