Inventor · disambiguated record
Tsai-Fu Hsiao
Also filed as: HSIAO TSAI-FU
17 granted patents·6 pending applications·128 citations·filing 1998–2022
93Inventor score
Files withUNITED MICROELECTRONICS CORP10TAIWAN SEMICONDUCTOR MFG CO LTD4HSIAO TSAI-FU2LU TSUO-WEN2WANG HSIANG-YING2
Top patents by PatentIndex Score
23 records- 0194US7473606B2Method for fabricating metal-oxide semiconductor transistorsUNITED MICROELECTRONICS CORP·Filed 2007·Granted Jan 6, 2009·27 cites·17 claims
- 0293US7553763B2Salicide process utilizing a cluster ion implantation processUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jun 30, 2009·22 cites·26 claims
- 0390US8183118B2Method for fabricating MOS transistorLU TSUO-WEN·Filed 2010·Granted May 22, 2012·12 cites·20 claims
- 0488US7396717B2Method of forming a MOS transistorUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jul 8, 2008·15 cites·18 claims
- 0587US7550336B2Method for fabricating an NMOS transistorUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jun 23, 2009·14 cites·18 claims
- 0683US7795101B2Method of forming a MOS transistorUNITED MICROELECTRONICS CORP·Filed 2010·Granted Sep 14, 2010·7 cites·10 claims
- 0782US9502305B2Method for manufacturing CMOS transistorUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 22, 2016·4 cites·9 claims
- 0877US9228260B1Wafer processing chamber, heat treatment apparatus and method for processing wafersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jan 5, 2016·3 cites·20 claims
- 0975US9006802B2Semiconductor device manufacturing methods and methods of forming insulating material layersHUANG GIN-CHEN·Filed 2011·Granted Apr 14, 2015·3 cites·20 claims
- 1069US12014922B2Apparatus for manufacturing a thin film and a method thereforTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 18, 2024·0 cites·20 claims
- 1167US7892935B2Semiconductor processUNITED MICROELECTRONICS CORP·Filed 2006·Granted Feb 22, 2011·2 cites·12 claims
- 1261US8076210B2Method for fabricating metal-oxide semiconductor transistorsHSIAO TSAI-FU·Filed 2011·Granted Dec 13, 2011·1 cites·5 claims
- 1361US7927954B2Method for fabricating strained-silicon metal-oxide semiconductor transistorsUNITED MICROELECTRONICS CORP·Filed 2007·Granted Apr 19, 2011·2 cites·27 claims
- 1457US8053847B2Method for fabricating metal-oxide semiconductor transistorsUNITED MICROELECTRONICS CORP·Filed 2008·Granted Nov 8, 2011·0 cites·18 claims
- 1553US2010001317A1Cmos transistor and the method for manufacturing the sameCHEN YI-WEI·Filed 2008·Application pending·0 cites
- 1652US9607826B2Semiconductor device manufacturing methods and methods of forming insulating material layersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Mar 28, 2017·0 cites·20 claims
- 1749US11244822B2Apparatus for manufacturing a thin film and a method thereforTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Feb 8, 2022·0 cites·20 claims
- 1849US2007228464A1MOS transistorWANG HSIANG-YING·Filed 2007·Application pending·0 cites
- 1945US6112013AApparatus for detecting a crack in a heater of an acid and rinse bath and a method of crack detection of the sameUNITED MICROELECTRONICS CORP·Filed 1998·Granted Aug 29, 2000·16 cites·14 claims
- 2045US2012202328A1Method for fabricating mos transistorLU TSUO-WEN·Filed 2012·Application pending·0 cites
- 2144US2008258178A1Method of forming a MOS transistorWANG HSIANG-YING·Filed 2008·Application pending·0 cites
- 2242US2006062913A1Process for depositing btbas-based silicon nitride filmsWANG YUN-REN·Filed 2004·Application pending·0 cites
- 2330US2012068268A1Transistor structure and method of fabricating the sameHSIAO TSAI-FU·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →