Inventor · disambiguated record
Changze Liu
Also filed as: LIU CHANGZE
3 granted patents·18 citations·filing 2011–2012
59Inventor score
Technology areasH10P
Files withHUANG RU3
Top patents by PatentIndex Score
3 records- 0190US9018968B2Method for testing density and location of gate dielectric layer trap of semiconductor deviceHUANG RU·Filed 2012·Granted Apr 28, 2015·17 cites·6 claims
- 0259US8866507B2Method for testing trap density of gate dielectric layer in semiconductor device having no substrate contactHUANG RU·Filed 2011·Granted Oct 21, 2014·1 cites·7 claims
- 0338US9099500B2Programmable array of silicon nanowire field effect transistor and method for fabricating the sameHUANG RU·Filed 2011·Granted Aug 4, 2015·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →