Inventor · disambiguated record
Krishna B. Rajan
Also filed as: RAJAN KRISHNA B · RAJAN Krishna
5 granted patents·2 pending applications·78 citations·filing 1991–2015
79Inventor score
Top patents by PatentIndex Score
7 records- 0176US7797594B1Built-in self-test of 3-dimensional semiconductor memory arraysORACLE AMERICA INC·Filed 2007·Granted Sep 14, 2010·12 cites·18 claims
- 0274US5625630AIncreasing testability by clock transformationLUCENT TECHNOLOGIES INC·Filed 1996·Granted Apr 29, 1997·39 cites·10 claims
- 0372US7779316B2Method of testing memory array at operational speed using scanORACLE AMERICA INC·Filed 2007·Granted Aug 17, 2010·6 cites·19 claims
- 0459US5590135ATesting a sequential circuitLUCENT TECHNOLOGIES INC·Filed 1991·Granted Dec 31, 1996·21 cites·1 claims
- 0546US10241148B2Virtual access of input/output (I/O) for test via an on-chip star networkNVIDIA CORP·Filed 2015·Granted Mar 26, 2019·0 cites·20 claims
- 0630US2003149926A1Single scan chain in hierarchiacally bisted designsFiled 2002·Application pending·0 cites
- 0730US2003188243A1Method and apparatus for delay fault testingFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →