Inventor · disambiguated record
Abel Alaniz
Also filed as: ALANIZ ABEL
3 granted patents·16 citations·filing 2008–2008
65Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0171US8086925B2Method and system for LBIST testing of an electronic circuitGASS BENJAMIN ROBERT·Filed 2008·Granted Dec 27, 2011·10 cites·19 claims
- 0259US7895490B2Method and system for testing an electronic circuit to identify multiple defectsIBM·Filed 2008·Granted Feb 22, 2011·4 cites·20 claims
- 0349US7873890B2Techniques for performing a Logic Built-In Self-Test in an integrated circuit deviceIBM·Filed 2008·Granted Jan 18, 2011·2 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →