Inventor · disambiguated record
Cheul Hee Koo
Also filed as: KOO CHEUL HEE
21 granted patents·1 pending application·97 citations·filing 2004–2015
93Inventor score
Top patents by PatentIndex Score
22 records- 0190US7782078B2On die termination circuit and method for calibrating the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 24, 2010·25 cites·15 claims
- 0284US7675337B2Duty cycle correcting circuit and duty cycle correcting methodHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 9, 2010·12 cites·20 claims
- 0383US8743632B2Nonvolatile memory device, operating method thereof, and data storage device having the sameSK HYNIX INC·Filed 2012·Granted Jun 3, 2014·8 cites·23 claims
- 0483US8207771B2Duty cycle correcting circuit and duty cycle correcting methodKOO CHEUL-HEE·Filed 2010·Granted Jun 26, 2012·6 cites·32 claims
- 0580US8085602B2Page buffer circuit, nonvolatile memory device including the page buffer circuit, and method of operating the nonvolatile memory deviceYANG CHANG WON·Filed 2011·Granted Dec 27, 2011·6 cites·4 claims
- 0677US9082487B2Program method of nonvolatile memory device for having dense threshold voltage distribution by controlling voltage of bit line according to threshold voltage of memory cellKOO CHEUL HEE·Filed 2011·Granted Jul 14, 2015·6 cites·2 claims
- 0776US7898876B2Page buffer circuit, nonvolatile memory device including the page buffer circuit, and method of operating the nonvolatile memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Mar 1, 2011·8 cites·6 claims
- 0876US7870414B2Clock tree circuit and semiconductor memory device using the same, and duty cycle correction methodHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jan 11, 2011·8 cites·23 claims
- 0963US8339880B2Circuit for controlling redundancy in semiconductor memory apparatusKOO CHEUL HEE·Filed 2011·Granted Dec 25, 2012·3 cites·15 claims
- 1059US7391660B2Address path circuit with row redundant schemeHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jun 24, 2008·4 cites·18 claims
- 1158US8902646B2Memory and method for operating the sameKOO CHEUL-HEE·Filed 2012·Granted Dec 2, 2014·2 cites·19 claims
- 1256US7903481B2Page buffer circuit, nonvolatile device including the same, and method of operating the nonvolatile memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Mar 8, 2011·3 cites·20 claims
- 1356US7511546B2Synchronous memory device with output driver controlllerHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 31, 2009·3 cites·6 claims
- 1452US9251901B2Semiconductor memory device with high threshold voltage distribution reliability methodSK HYNIX INC·Filed 2013·Granted Feb 2, 2016·1 cites·10 claims
- 1546US8582362B2Circuit for precharging bit line and nonvolatile memory device including the sameKOO CHEUL HEE·Filed 2009·Granted Nov 12, 2013·1 cites·11 claims
- 1643US8908462B2Semiconductor device including current compensatorSK HYNIX INC·Filed 2013·Granted Dec 9, 2014·0 cites·8 claims
- 1741US9627070B2Program method of nonvolatile memory device for having dense threshold voltage distribution by controlling voltage of bit line according to threshold voltage of memory cellSK HYNIX INC·Filed 2015·Granted Apr 18, 2017·0 cites·14 claims
- 1841US8184482B2Nonvolatile memory device for preventing a source line bouncing phenomenonKOO CHEUL HEE·Filed 2009·Granted May 22, 2012·0 cites·10 claims
- 1939US7391248B2Duty cycle corrector of delay locked loopHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jun 24, 2008·0 cites·18 claims
- 2037US7099228B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Aug 29, 2006·1 cites·18 claims
- 2136US7679983B2Address path circuit with row redundant schemeHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 16, 2010·0 cites·18 claims
- 2236US2009213671A1Circuit and method for controlling redundancy in semiconductor memory apparatusKOO CHEUL HEE·Filed 2008·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Cheul Hee Koo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →