Inventor · disambiguated record
Wu-Tung Cheng
Also filed as: CHENG WU-TUNG · CHENG WU-TUNG J
86 granted patents·7 pending applications·1,038 citations·filing 1999–2022
99Inventor score
Top patents by PatentIndex Score
93 records- 0199US7818644B2Multi-stage test response compactorsRAJSKI JANUSZ·Filed 2007·Granted Oct 19, 2010·65 cites·60 claims
- 0297US11408938B2Bidirectional scan cells for single-path reversible scan chainsSIEMENS IND SOFTWARE INC·Filed 2020·Granted Aug 9, 2022·4 cites·19 claims
- 0396US11073556B2Low pin count reversible scan architectureMENTOR GRAPHICS CORP·Filed 2020·Granted Jul 27, 2021·6 cites·20 claims
- 0496US7395473B2Removing the effects of unknown test values from compacted test responsesCHENG WU-TUNG·Filed 2005·Granted Jul 1, 2008·34 cites·34 claims
- 0595US9778316B2Multi-stage test response compactorsMENTOR GRAPHICS CORP·Filed 2016·Granted Oct 3, 2017·5 cites·13 claims
- 0695US8280688B2Compactor independent direct diagnosis of test hardwareHUANG YU·Filed 2010·Granted Oct 2, 2012·16 cites·20 claims
- 0795US7729884B2Compactor independent direct diagnosis of test hardwareHUANG YU·Filed 2005·Granted Jun 1, 2010·48 cites·34 claims
- 0894US10592625B1Cell-aware root cause deconvolution for defect diagnosis and yield analysisMENTOR GRAPHICS CORP·Filed 2018·Granted Mar 17, 2020·17 cites·18 claims
- 0994US7840865B2Built-in self-test of integrated circuits using selectable weighting of test patternsMENTOR GRAPHICS CORP·Filed 2007·Granted Nov 23, 2010·35 cites·23 claims
- 1094US7487419B2Reduced-pin-count-testing architectures for applying test patternsMUKHERJEE NILANJAN·Filed 2005·Granted Feb 3, 2009·62 cites·47 claims
- 1194US7434131B2Flexible memory built-in-self-test (MBIST) method and apparatusMUKHERJEE NILANJAN·Filed 2005·Granted Oct 7, 2008·32 cites·27 claims
- 1293US11320487B1Programmable test compactor for improving defect determinationSIEMENS IND SOFTWARE INC·Filed 2021·Granted May 3, 2022·2 cites·20 claims
- 1393US9689918B1Test access architecture for stacked memory and logic diesMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 27, 2017·15 cites·18 claims
- 1492US7426668B2Performing memory built-in-self-test (MBIST)MUKHERJEE NILANJAN·Filed 2005·Granted Sep 16, 2008·27 cites·23 claims
- 1591US11092645B2Chain testing and diagnosis using two-dimensional scan architectureMENTOR GRAPHICS CORP·Filed 2019·Granted Aug 17, 2021·4 cites·12 claims
- 1691US11010523B1Prediction of test pattern counts for scan configuration determinationMENTOR GRAPHICS CORP·Filed 2020·Granted May 18, 2021·3 cites·22 claims
- 1791US9222978B2Two-dimensional scan architectureHUANG YU·Filed 2012·Granted Dec 29, 2015·11 cites·13 claims
- 1891US7296249B2Using constrained scan cells to test integrated circuitsRINDERKNECHT THOMAS HANS·Filed 2004·Granted Nov 13, 2007·54 cites·29 claims
- 1990US8689070B2Method and system for scan chain diagnosisHUANG YU·Filed 2010·Granted Apr 1, 2014·12 cites·26 claims
- 2090US8316265B2Test pattern generation for diagnosing scan chain failuresGUO RUIFENG·Filed 2009·Granted Nov 20, 2012·17 cites·35 claims
- 2190US8280687B2Direct fault diagnostics using per-pattern compactor signaturesCHENG WU-TUNG·Filed 2006·Granted Oct 2, 2012·20 cites·45 claims
- 2290US7716548B2Removing the effects of unknown test values from compacted test responsesCHENG WU-TUNG·Filed 2008·Granted May 11, 2010·16 cites·37 claims
- 2389US8261142B2Generating test sets for diagnosing scan chain failuresGUO RUIFENG·Filed 2008·Granted Sep 4, 2012·14 cites·23 claims
- 2489US6829728B2Full-speed BIST controller for testing embedded synchronous memoriesFiled 2001·Granted Dec 7, 2004·58 cites·41 claims
- 2588US11156661B2Reversible multi-bit scan cell-based scan chains for improving chain diagnostic resolutionMENTOR GRAPHICS CORP·Filed 2020·Granted Oct 26, 2021·2 cites·20 claims
- 2688US7428680B2Programmable memory built-in-self-test (MBIST) method and apparatusMUKHERJEE NILANJAN·Filed 2005·Granted Sep 23, 2008·17 cites·21 claims
- 2787US11635462B2Library cell modeling for transistor-level test pattern generationMENTOR GRAPHICS CORP·Filed 2020·Granted Apr 25, 2023·2 cites·17 claims
- 2887US11041906B2Optimized scan chain diagnostic pattern generation for reversible scan architectureMENTOR GRAPHICS CORP·Filed 2019·Granted Jun 22, 2021·3 cites·23 claims
- 2987US10234502B1Circuit defect diagnosis based on sink cell fault modelsMENTOR GRAPHICS CORP·Filed 2017·Granted Mar 19, 2019·3 cites·20 claims
- 3087US7788561B2Diagnosing mixed scan chain and system logic defectsHUANG YU·Filed 2007·Granted Aug 31, 2010·15 cites·60 claims
- 3187US7239978B2Compactor independent fault diagnosisCHENG WU-TUNG·Filed 2004·Granted Jul 3, 2007·45 cites·46 claims
- 3287US7036064B1Synchronization point across different memory BIST controllersKEBICHI OMAR·Filed 2001·Granted Apr 25, 2006·54 cites·35 claims
- 3386US9135103B2Hybrid memory failure bitmap classificationMENTOR GRAPHICS CORP·Filed 2013·Granted Sep 15, 2015·11 cites·18 claims
- 3486US9057762B1Faulty chains identification without masking chain patternsMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 16, 2015·6 cites·18 claims
- 3586US7831871B2Testing embedded memories in an integrated circuitMENTOR GRAPHICS CORP·Filed 2009·Granted Nov 9, 2010·16 cites·45 claims
- 3686US6456961B1Method and apparatus for creating testable circuit designs having embedded coresFiled 1999·Granted Sep 24, 2002·66 cites·18 claims
- 3785US6934897B2Scheduling the concurrent testing of multiple cores embedded in an integrated circuitFiled 2002·Granted Aug 23, 2005·41 cites·37 claims
- 3884US8607107B2Test access mechanism for diagnosis based on partitioining scan chainsCHENG WU-TUNG·Filed 2011·Granted Dec 10, 2013·5 cites·24 claims
- 3984US7836366B2Defect localization based on defective cell diagnosisMENTOR GRAPHICS CORP·Filed 2007·Granted Nov 16, 2010·12 cites·42 claims
- 4083US8843796B2Profiling-based scan chain diagnosisCHENG WU-TUNG·Filed 2011·Granted Sep 23, 2014·5 cites·18 claims
- 4183US8086923B2Accurately identifying failing scan bits in compression environmentsCHENG WU-TUNG·Filed 2008·Granted Dec 27, 2011·11 cites·7 claims
- 4281US10795751B2Cell-aware diagnostic pattern generation for logic diagnosisMENTOR GRAPHICS CORP·Filed 2018·Granted Oct 6, 2020·2 cites·18 claims
- 4381US9443051B2Generating root cause candidates for yield analysisMENTOR GRAPHICS CORP·Filed 2013·Granted Sep 13, 2016·6 cites·15 claims
- 4480US11361248B2Multi-stage machine learning-based chain diagnosisSIEMENS IND SOFTWARE INC·Filed 2019·Granted Jun 14, 2022·5 cites·20 claims
- 4580US9086459B2Detection and diagnosis of scan cell internal defectsGUO RUIFENG·Filed 2009·Granted Jul 21, 2015·10 cites·14 claims
- 4680US8661304B2Test pattern generation for diagnosing scan chain failuresMENTOR GRAPHICS CORP·Filed 2012·Granted Feb 25, 2014·3 cites·13 claims
- 4779US9110138B2Fault dictionary based scan chain failure diagnosisMENTOR GRAPHICS CORP·Filed 2013·Granted Aug 18, 2015·3 cites·18 claims
- 4879US8935582B2Generating test sets for diagnosing scan chain failuresGUO RUIFENG·Filed 2012·Granted Jan 13, 2015·3 cites·14 claims
- 4979US8615695B2Fault dictionary-based scan chain failure diagnosisGUO RUIFENG·Filed 2007·Granted Dec 24, 2013·8 cites·36 claims
- 5079US8527232B2Diagnostic test pattern generation for small delay defectGUO RUIFENG·Filed 2010·Granted Sep 3, 2013·4 cites·12 claims
Showing the top 50 of 93 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →