Inventor · disambiguated record
Masaaki Inaba
Also filed as: INABA MASAAKI
10 granted patents·2 pending applications·96 citations·filing 2002–2008
90Inventor score
Top patents by PatentIndex Score
12 records- 0188US6708072B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Mar 16, 2004·32 cites·22 claims
- 0287US7551976B2Industrial device receiving remote maintenance operation and outputting charge informationHITACHI LTD·Filed 2007·Granted Jun 23, 2009·12 cites·2 claims
- 0387US7177539B2Camera lens positioning device using shape memory alloy and camera using the positioning deviceNOKIA CORP·Filed 2005·Granted Feb 13, 2007·11 cites·6 claims
- 0481US7373501B2System and method for on-line diagnosticsHITACHI HIGH TECH CORP·Filed 2003·Granted May 13, 2008·18 cites·3 claims
- 0576US6792325B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Sep 14, 2004·6 cites·9 claims
- 0674US6954677B2Remote maintenance method for industrial device that generates maintenance charge information using received charge listHITACHI LTD·Filed 2004·Granted Oct 11, 2005·4 cites·4 claims
- 0770US7849304B2System and method for on-line diagnosticsHITACHI HIGH TECH CORP·Filed 2007·Granted Dec 7, 2010·1 cites·66 claims
- 0865US7047096B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2004·Granted May 16, 2006·6 cites·4 claims
- 0964US6862485B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Mar 1, 2005·6 cites·8 claims
- 1062US2008133032A1System and method for on-line diagnosticsARIMA JUNTARO·Filed 2007·Application pending·0 cites
- 1151US7177715B2Remote maintenance method for generating maintenance charge information, industrial device, and semiconductor deviceHITACHI LTD·Filed 2004·Granted Feb 13, 2007·0 cites·4 claims
- 1248US2009320239A1Apparatus for fold hinge assemblies for electronic devices and associated methodsNOKIA CORP·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →