Inventor · disambiguated record
Brian Roberts Routh, Jr.
Also filed as: ROUTH BRIAN ROBERTS · ROUTH JR BRIAN · ROUTH JR BRIAN ROBERTS
17 granted patents·1 pending application·45 citations·filing 2011–2023
91Inventor score
Top patents by PatentIndex Score
18 records- 0193US9601313B2Automated TEM sample preparationFEI CO·Filed 2015·Granted Mar 21, 2017·14 cites·20 claims
- 0288US11069509B1Method and system for backside planar view lamella preparationFEI CO·Filed 2020·Granted Jul 20, 2021·3 cites·20 claims
- 0383US9275828B2Source for selectively providing positively or negatively charged particles for a focusing columnFEI CO·Filed 2014·Granted Mar 1, 2016·4 cites·20 claims
- 0483US8716673B2Inductively coupled plasma source as an electron beam source for spectroscopic analysisROUTH JR BRIAN ROBERTS·Filed 2011·Granted May 6, 2014·7 cites·23 claims
- 0581US10340119B2Automated TEM sample preparationFEI CO·Filed 2017·Granted Jul 2, 2019·2 cites·24 claims
- 0681US10068749B2Preparation of lamellae for TEM viewingFULLER SCOTT EDWARD·Filed 2013·Granted Sep 4, 2018·5 cites·20 claims
- 0779US11176656B2Artificial intelligence-enabled preparation end-pointingFEI CO·Filed 2019·Granted Nov 16, 2021·2 cites·22 claims
- 0879US9281163B2High capacity TEM gridFEI CO·Filed 2014·Granted Mar 8, 2016·4 cites·24 claims
- 0975US10825651B2Automated TEM sample preparationFEI CO·Filed 2019·Granted Nov 3, 2020·1 cites·20 claims
- 1074US8766214B2Method of preparing and imaging a lamella in a particle-optical apparatusFEI CO·Filed 2013·Granted Jul 1, 2014·3 cites·20 claims
- 1168US11847813B2Artificial intelligence-enabled preparation end-pointingFEI CO·Filed 2021·Granted Dec 19, 2023·0 cites·22 claims
- 1268US11798804B2Method of material depositionFEI CO·Filed 2020·Granted Oct 24, 2023·0 cites·15 claims
- 1362US12249482B2Microscopy feedback for improved milling accuracyFEI CO·Filed 2022·Granted Mar 11, 2025·0 cites·26 claims
- 1459US11069523B2Method of material depositionFEI CO·Filed 2018·Granted Jul 20, 2021·0 cites·12 claims
- 1559US2024071720A1Method and system for preparing a specimenFEI CO·Filed 2023·Application pending·0 cites
- 1657US9601312B2Source for selectively providing positively or negatively charged particles for a focusing columnFEI CO·Filed 2016·Granted Mar 21, 2017·0 cites·19 claims
- 1754US9978586B2Method of material depositionFEI CO·Filed 2016·Granted May 22, 2018·0 cites·16 claims
- 1853US11355313B2Line-based endpoint detectionFEI CO·Filed 2020·Granted Jun 7, 2022·0 cites·23 claims
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