Inventor · disambiguated record
John F. Hagios
Also filed as: HAGIOS JOHN F
5 granted patents·57 citations·filing 2003–2009
79Inventor score
Top patents by PatentIndex Score
5 records- 0175US6967557B2Wafer test space transformerIBM·Filed 2003·Granted Nov 22, 2005·22 cites·9 claims
- 0275US6720789B1Method for wafer test and wafer test system for implementing the methodIBM·Filed 2003·Granted Apr 13, 2004·19 cites·17 claims
- 0374US7688089B2Compliant membrane thin film interposer probe for intergrated circuit device testingIBM·Filed 2008·Granted Mar 30, 2010·6 cites·9 claims
- 0463US7084651B2Probe card assemblyIBM·Filed 2004·Granted Aug 1, 2006·10 cites·31 claims
- 0543US8640324B2Method of fabricating a compliant membrane probeAUDETTE DAVID M·Filed 2009·Granted Feb 4, 2014·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →