Inventor · disambiguated record
James Mitchell
Also filed as: MITCHELL JAMES · MITCHELL JAMES A · MITCHELL JAMES A H · MITCHELL JAMES ANTHONY
23 granted patents·4 pending applications·773 citations·filing 1975–2025
96Inventor score
Top patents by PatentIndex Score
27 records- 0193US6526320B2Apparatus for thermal treatment of tissueUNITED STATES SURGICAL CORP·Filed 2001·Granted Feb 25, 2003·439 cites·18 claims
- 0289US6920655B2Multi-purpose matFiled 2003·Granted Jul 26, 2005·42 cites·18 claims
- 0388US8589723B2Method and apparatus to provide a high availability solid state driveKUMAR PANAKAJ·Filed 2010·Granted Nov 19, 2013·51 cites·18 claims
- 0487US7958283B2Observing an internal link via a second linkINTEL CORP·Filed 2008·Granted Jun 7, 2011·20 cites·16 claims
- 0583US7027886B2Infinitely variable, order specific, holistic assembly process control systemDEERE & CO·Filed 2005·Granted Apr 11, 2006·12 cites·1 claims
- 0680US9772179B2Chain wear monitoring deviceFROST CHARLES C·Filed 2014·Granted Sep 26, 2017·9 cites·28 claims
- 0779US9698467B2Wired ethernet adaptor for portable electronic devicesBOEING CO·Filed 2013·Granted Jul 4, 2017·5 cites·21 claims
- 0878US4109938ASystem for arranging and retrieving informationMITCHELL BEAZLEY ENCYCLOPEDIAS·Filed 1975·Granted Aug 29, 1978·31 cites·10 claims
- 0976US4841476AExtended floating point operations supporting emulation of source instruction executionIBM·Filed 1986·Granted Jun 20, 1989·73 cites·5 claims
- 1074US10145770B2Chain wear monitoring deviceFROST TECH LLC·Filed 2015·Granted Dec 4, 2018·4 cites·11 claims
- 1174US6444982B1Dissolution stage for an environmental scanning electron microscopeEURO CELTIQUE SA·Filed 2000·Granted Sep 3, 2002·10 cites·30 claims
- 1265US8285907B2Packet processing in switched fabric networksCHAPPELL CHRISTOPHER L·Filed 2004·Granted Oct 9, 2012·15 cites·16 claims
- 1365US4124943AAudio visual information systemMITCHELL BEAZLEY ENCYCLOPEDIAS·Filed 1975·Granted Nov 14, 1978·19 cites·24 claims
- 1464US6130434ADissolution stage for an environmental scanning electron microscopeEURO CELTIQUE SA·Filed 1999·Granted Oct 10, 2000·15 cites·23 claims
- 1563US6990383B2Infinitely variable, order specific, holistic assembly process control systemDEERE & CO·Filed 2004·Granted Jan 24, 2006·4 cites·2 claims
- 1662US8019972B2Digital signal processor having a plurality of independent dedicated processorsINTEL CORP·Filed 2010·Granted Sep 13, 2011·1 cites·19 claims
- 1762US7013193B2Infinitely variable, order specific, holistic assembly process control systemDEERE & CO·Filed 2005·Granted Mar 14, 2006·2 cites·1 claims
- 1861US7013194B2Infinitely variable, order specific, holistic assembly process control systemDEERE & CO·Filed 2005·Granted Mar 14, 2006·2 cites·1 claims
- 1958US12229073B2Systems, apparatus and methods for rapid peripheral component interconnect express (PCIE) system bootINTEL CORP·Filed 2021·Granted Feb 18, 2025·0 cites·19 claims
- 2057US2025249432A1Super absorbent utility pad and methods of using sameGEERPRES INC·Filed 2025·Application pending·0 cites
- 2152US10817454B2Dynamic lane access switching between PCIe root spacesINTEL CORP·Filed 2019·Granted Oct 27, 2020·0 cites·20 claims
- 2251US5004646AProcess for treating metal surfacesBRITISH PETROLEUM CO PLC·Filed 1989·Granted Apr 2, 1991·17 cites·19 claims
- 2351US2014275138A1Method and products for treating diabetesCBA PHARMA INC·Filed 2014·Application pending·0 cites
- 2446US2006140126A1Arbitrating virtual channel transmit queues in a switched fabric networkINTEL CORP·Filed 2004·Application pending·0 cites
- 2544US7010375B2Infinitely variable, order specific, holistic assembly process control systemDEERE & CO·Filed 2005·Granted Mar 7, 2006·0 cites·1 claims
- 2639US2011238909A1Multicasting Write Requests To Multiple Storage ControllersKUMAR PANKAJ·Filed 2010·Application pending·0 cites
- 2729US7793076B1Digital signals processor having a plurality of independent dedicated processorsINTEL CORP·Filed 1999·Granted Sep 7, 2010·2 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →