Inventor · disambiguated record
David L. Willenborg
Also filed as: WILLENBORG DAVID · WILLENBORG DAVID L
8 granted patents·4 pending applications·1,948 citations·filing 1978–2007
92Inventor score
Top patents by PatentIndex Score
12 records- 0198US5412473AMultiple angle spectroscopic analyzer utilizing interferometric and ellipsometric devicesTHERMA WAVE INC·Filed 1993·Granted May 2, 1995·241 cites·34 claims
- 0298US5159412AOptical measurement device with enhanced sensitivityTHERMA WAVE INC·Filed 1991·Granted Oct 27, 1992·190 cites·13 claims
- 0398US5042951AHigh resolution ellipsometric apparatusTHERMA WAVE INC·Filed 1989·Granted Aug 27, 1991·483 cites·24 claims
- 0498US4999014AMethod and apparatus for measuring thickness of thin filmsTHERMA WAVE INC·Filed 1989·Granted Mar 12, 1991·539 cites·44 claims
- 0596US5596406ASample characteristic analysis utilizing multi wavelength and multi angle polarization and magnitude change detectionTHERMA WAVE INC·Filed 1995·Granted Jan 21, 1997·203 cites·9 claims
- 0696US4579463ADetecting thermal waves to evaluate thermal parametersTHERMA WAVE PARTNERS·Filed 1984·Granted Apr 1, 1986·187 cites·7 claims
- 0789US4795260AApparatus for locating and testing areas of interest on a workpieceTHERMA WAVE INC·Filed 1987·Granted Jan 3, 1989·102 cites·23 claims
- 0845US2004207836A1High dynamic range optical inspection system and methodFiled 2003·Application pending·0 cites
- 0940US2005146719A1Method and apparatus for illuminating a substrate during inspectionFiled 2004·Application pending·0 cites
- 1039US2006120832A1Method and apparatus for handling a substrateCHHIBBER RAJESHWAR·Filed 2004·Application pending·0 cites
- 1139US2007229833A1High-sensitivity surface detection system and methodROSENCWAIG ALLAN·Filed 2007·Application pending·0 cites
- 1227US4188118AManipulator for rotating and examining small spheresUS ENERGY·Filed 1978·Granted Feb 12, 1980·3 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when David L. Willenborg files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →