Inventor · disambiguated record
Xiaojian Ding
Also filed as: DING XIAOJIAN
9 granted patents·6 pending applications·98 citations·filing 2008–2024
80Inventor score
Files withHUANG MAOLIN3CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES2CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH2CHINA ELECTRONIC PRODUCT REALIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE1CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIROMENTAL TESTING RES INSTITUTE1
Top patents by PatentIndex Score
15 records- 0192US8745417B2Computer system and notebook computer, and method for controlling computer systemHUANG MAOLIN·Filed 2008·Granted Jun 3, 2014·94 cites·22 claims
- 0280US12079550B1Wiener process-based method and device for processing accelerated degradation testing dataCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2024·Granted Sep 3, 2024·1 cites·11 claims
- 0367US11316774B2Path selection method and apparatusHUAWEI TECH CO LTD·Filed 2019·Granted Apr 26, 2022·1 cites·18 claims
- 0459US2024255396A1Product Reliability Evaluation Method And Apparatus Based On Multi-Stress Coupling Acceleration ModelCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH·Filed 2024·Application pending·0 cites
- 0557US12124248B1Method and apparatus for processing accelerated test data based on multiple performance degradation, and computer deviceCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2024·Granted Oct 22, 2024·0 cites·7 claims
- 0657US2024378646A1Method and apparatus for estimating product lifetime based on multi-stress accelerated test, and computer deviceCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIROMENTAL TESTING RES INSTITUTE·Filed 2024·Application pending·0 cites
- 0755US2024386339A1Accelerated Test Data Analysis Method And Apparatus Based On Gray Forecast Model, And DeviceCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2024·Application pending·0 cites
- 0851US2024378130A1Performance degradation-based product reliability weak link evaluation method and apparatusCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH·Filed 2024·Application pending·0 cites
- 0951US2023131828A1Predictive maintenance system and method for intelligent manufacturing equipmentCHINA ELECTRONICS RELIABILITY AND ENVIRONMENTAL TESTING INST THE FIFTH INST OF ELECTRONI·Filed 2022·Application pending·0 cites
- 1050US12174715B2Deep learning method integrating prior knowledge for fault diagnosisUNIV HEFEI TECHNOLOGY·Filed 2021·Granted Dec 24, 2024·0 cites·8 claims
- 1149US2024338270A1Method and apparatus for reliability evaluation based on multiple performance degradation, and deviceCHINA ELECTRONIC PRODUCT REALIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE·Filed 2024·Application pending·0 cites
- 1246US8479031B2System switching unit having a switch to switch on/off a channel for data interaction between a first system and the bus interface of a second system according to the operation state of the second systemGAO JINXUAN·Filed 2009·Granted Jul 2, 2013·2 cites·12 claims
- 1345US9009356B2Data output method and apparatusHE ZHIQIANG·Filed 2008·Granted Apr 14, 2015·0 cites·11 claims
- 1445US8266457B2Data processing device and method for switching states thereofHUANG MAOLIN·Filed 2009·Granted Sep 11, 2012·0 cites·8 claims
- 1543US9696823B2Computer and method for sharing input device thereofHUANG MAOLIN·Filed 2009·Granted Jul 4, 2017·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →