Inventor · disambiguated record
Tim Damon
Also filed as: DAMON TIM · DAMON TIM G
8 granted patents·86 citations·filing 1997–2004
87Inventor score
Files withMICRON TECHNOLOGY INC8
Top patents by PatentIndex Score
8 records- 0176US6510533B1Method for detecting or repairing intercell defects in more than one array of a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 21, 2003·21 cites·18 claims
- 0274US6256593B1System for evaluating and reporting semiconductor test processesMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·19 cites·25 claims
- 0367US6762608B2Apparatus and method for testing fusesMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 13, 2004·10 cites·44 claims
- 0465US6410352B2Apparatus and method for testing fusesMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 25, 2002·9 cites·28 claims
- 0553US6424161B2Apparatus and method for testing fusesMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 23, 2002·13 cites·25 claims
- 0649US6167541AMethod for detecting or preparing intercell defects in more than one array of a memory deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 26, 2000·11 cites·17 claims
- 0732US7464308B2CAM expected address search testmodeMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 9, 2008·0 cites·21 claims
- 0829US6070131ASystem for evaluating and reporting semiconductor test processesMICRON TECHNOLOGY INC·Filed 1997·Granted May 30, 2000·3 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →