Inventor · disambiguated record
Takahiro Shikibu
Also filed as: SHIKIBU TAKAHIRO
7 granted patents·5 citations·filing 2015–2024
72Inventor score
Files withFUJITSU LTD7
Top patents by PatentIndex Score
7 records- 0174US9797949B2Test circuit and method of controlling test circuitFUJITSU LTD·Filed 2015·Granted Oct 24, 2017·2 cites·15 claims
- 0268US10593645B2Semiconductor device having a plurality of chips being stackedFUJITSU LTD·Filed 2016·Granted Mar 17, 2020·3 cites·10 claims
- 0356US12461858B2ProcessorFUJITSU LTD·Filed 2024·Granted Nov 4, 2025·0 cites·7 claims
- 0445US11914538B2Semiconductor apparatus and transfer methodFUJITSU LTD·Filed 2021·Granted Feb 27, 2024·0 cites·13 claims
- 0534US9823291B2Semiconductor device and method of testing semiconductor deviceFUJITSU LTD·Filed 2015·Granted Nov 21, 2017·0 cites·5 claims
- 0632US9835685B2Test circuit and method for controlling test circuitFUJITSU LTD·Filed 2015·Granted Dec 5, 2017·0 cites·6 claims
- 0732US9746878B2Semiconductor device and method of testing semiconductor deviceFUJITSU LTD·Filed 2015·Granted Aug 29, 2017·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →