Inventor · disambiguated record
Stephan Thiberge
Also filed as: THIBERGE STEPHAN · THIBERGE STEPHAN YVES
4 granted patents·82 citations·filing 2003–2005
80Inventor score
Technology areasH01J
Top patents by PatentIndex Score
4 records- 0191US7253418B2Device and method for the examination of samples in a non vacuum environment using a scanning electron microscopeEL MUL TECHNOLOGIES LTD·Filed 2005·Granted Aug 7, 2007·19 cites·20 claims
- 0288US6992300B2Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscopeEL MUL TECHNOLOGIES LTD·Filed 2003·Granted Jan 31, 2006·28 cites·28 claims
- 0384US6989542B2Device and method for the examination of samples in a non vacuum environment using a scanning electron microscopeEL MUL TECHNOLOGIES LTD·Filed 2004·Granted Jan 24, 2006·20 cites·10 claims
- 0477US7304313B2Low-pressure chamber for scanning electron microscopy in a wet environmentYEDA RES & DEV·Filed 2003·Granted Dec 4, 2007·15 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →